TY - JOUR
T1 - Multilevel testability analysis and solutions for integrated bluetooth transceivers
AU - Ozev, Sule
AU - Olgaard, Christian V.
AU - Orailoglu, Alex
N1 - Funding Information:
This work is partially supported through an IBM fellowship, the National Semiconductor Corp., and the University of California Micro Office.
PY - 2002/9
Y1 - 2002/9
N2 - An attempt was made to show how to incorporate testability analysis into the design flow at early stages and thus provide low-cost test solutions. To do so, testability tradeoffs were analyzed for a radio system at multiple levels. For this analysis, Bluetooth transceiver systems with no I/O access to internal blocks were used. The resultant data was analyzed in detail.
AB - An attempt was made to show how to incorporate testability analysis into the design flow at early stages and thus provide low-cost test solutions. To do so, testability tradeoffs were analyzed for a radio system at multiple levels. For this analysis, Bluetooth transceiver systems with no I/O access to internal blocks were used. The resultant data was analyzed in detail.
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U2 - 10.1109/MDT.2002.1033796
DO - 10.1109/MDT.2002.1033796
M3 - Article
AN - SCOPUS:0036735842
SN - 2168-2356
VL - 19
SP - 82
EP - 91
JO - IEEE Design and Test of Computers
JF - IEEE Design and Test of Computers
IS - 5
ER -