Multi-physics modeling of hysteresis in vanadium dioxide thin films

Chandika Annasiwatta, Jinhao Chen, Jordan M. Berg, Ayrton Bernussi, Zhaoyang Fan, Beibei Ren

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

Vanadium dioxide (VO2) exhibits a strong metal-insulator transition (MIT) near 68°C. The resulting changes in electrical, optical, thermal and mechanical properties make VO2 thin films interesting for a variety of sensor and actuator applications. The transition displays significant hysteresis that may significantly affect device performance. An accurate model of the transition would be valuable for predicting and compensating these effects. In this paper we investigate first-principles, multi-physics models using simultaneous measurement of optical and electrical properties. Our experimental results strongly validate use of a standard Preisach model to capture hysteresis in the optical properties of the VO2 film. We then investigate several physics-based models relating electrical resistivity to the fraction of material transformed. Of the models investigated, a percolation-based approach is the most successful. There are opportunities for further refinement of the resistivity model and explicit treatment of temperature dependence.

Original languageEnglish (US)
Title of host publication2016 American Control Conference, ACC 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages6905-6910
Number of pages6
ISBN (Electronic)9781467386821
DOIs
StatePublished - Jul 28 2016
Externally publishedYes
Event2016 American Control Conference, ACC 2016 - Boston, United States
Duration: Jul 6 2016Jul 8 2016

Publication series

NameProceedings of the American Control Conference
Volume2016-July
ISSN (Print)0743-1619

Other

Other2016 American Control Conference, ACC 2016
CountryUnited States
CityBoston
Period7/6/167/8/16

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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