MoS <inf>2</inf> heterojunctions by thickness modulation

Mahmut Tosun, Deyi Fu, Sujay B. Desai, Changhyun Ko, Jeong Seuk Kang, Der Hsien Lien, Mohammad Najmzadeh, Sefaattin Tongay, Junqiao Wu, Ali Javey

Research output: Contribution to journalArticle

43 Citations (Scopus)

Abstract

In this work, we report lateral heterojunction formation in as-exfoliated MoS 2 flakes by thickness modulation. Kelvin probe force microscopy is used to map the surface potential at the monolayer-multilayer heterojunction, and consequently the conduction band offset is extracted. Scanning photocurrent microscopy is performed to investigate the spatial photocurrent response along the length of the device including the source and the drain contacts as well as the monolayer-multilayer junction. The peak photocurrent is measured at the monolayer-multilayer interface, which is attributed to the formation of a type-I heterojunction. The work presents experimental and theoretical understanding of the band alignment and photoresponse of thickness modulated MoS 2 junctions with important implications for exploring novel optoelectronic devices.

Original languageEnglish (US)
Article number10990
JournalScientific Reports
Volume5
DOIs
StatePublished - Jun 30 2015
Externally publishedYes

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photocurrents
heterojunctions
modulation
microscopy
flakes
optoelectronic devices
conduction bands
alignment
scanning
probes

ASJC Scopus subject areas

  • General

Cite this

Tosun, M., Fu, D., Desai, S. B., Ko, C., Seuk Kang, J., Lien, D. H., ... Javey, A. (2015). MoS <inf>2</inf> heterojunctions by thickness modulation. Scientific Reports, 5, [10990]. https://doi.org/10.1038/srep10990

MoS <inf>2</inf> heterojunctions by thickness modulation. / Tosun, Mahmut; Fu, Deyi; Desai, Sujay B.; Ko, Changhyun; Seuk Kang, Jeong; Lien, Der Hsien; Najmzadeh, Mohammad; Tongay, Sefaattin; Wu, Junqiao; Javey, Ali.

In: Scientific Reports, Vol. 5, 10990, 30.06.2015.

Research output: Contribution to journalArticle

Tosun, M, Fu, D, Desai, SB, Ko, C, Seuk Kang, J, Lien, DH, Najmzadeh, M, Tongay, S, Wu, J & Javey, A 2015, 'MoS <inf>2</inf> heterojunctions by thickness modulation', Scientific Reports, vol. 5, 10990. https://doi.org/10.1038/srep10990
Tosun M, Fu D, Desai SB, Ko C, Seuk Kang J, Lien DH et al. MoS <inf>2</inf> heterojunctions by thickness modulation. Scientific Reports. 2015 Jun 30;5. 10990. https://doi.org/10.1038/srep10990
Tosun, Mahmut ; Fu, Deyi ; Desai, Sujay B. ; Ko, Changhyun ; Seuk Kang, Jeong ; Lien, Der Hsien ; Najmzadeh, Mohammad ; Tongay, Sefaattin ; Wu, Junqiao ; Javey, Ali. / MoS <inf>2</inf> heterojunctions by thickness modulation. In: Scientific Reports. 2015 ; Vol. 5.
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AU - Najmzadeh, Mohammad

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