Abstract
In this paper, we employed Ramen spectroscopy to monitor oxygen movement at the electrode/oxide interface by inserting single-layer graphene (SLG). Raman area mapping and single-point measurements show noticeable changes in the D-band, G-band, and 2D-band signals of the SLG during consecutive electrical programming repeated for nine cycles. In addition, the inserted SLG enables the reduction of RESET current by 22 times and programming power consumption by 47 times. Collectively, our results show that monitoring the oxygen movement by Raman spectroscopy for a resistive random access memory (RRAM) is made possible by inserting a single-layer graphene at electrode/oxide interface. This may open up an important analysis tool for investigation of switching mechanism of RRAM.
Original language | English (US) |
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Pages (from-to) | 651-657 |
Number of pages | 7 |
Journal | Nano Letters |
Volume | 13 |
Issue number | 2 |
DOIs | |
State | Published - Feb 13 2013 |
Externally published | Yes |
Keywords
- Graphene
- Raman spectroscopy
- filaments
- oxygen ions movement
- resistive random access memory
ASJC Scopus subject areas
- Bioengineering
- General Chemistry
- General Materials Science
- Condensed Matter Physics
- Mechanical Engineering