Molecular ion imaging and dynamic secondary ion mass spectrometry of organic compounds

Greg Gillen, David S. Simons, Peter Williams

Research output: Contribution to journalArticle

69 Citations (Scopus)

Abstract

An ion microscope equipped with a resistive anode encoder imaging system has been used to acquire molecular secondary ion images, with lateral resolutions on the order of 1 μm, from several quaternary ammonium salts, an amino acid, and a polynuclear aromatic hydrocarbon which were deposited onto copper transmission electron microscope grids. All images were generated by using the secondary ion signal of the parent molecular species. The variation of parent and fragment molecular ion signals with primary ion dose indicates that, for many bulk organic compounds, bombardment-induced fragmentation of parent molecules saturates at primary ion doses of (1-8) × 1014 ions/cm2. Subsequent ion impacts cause little further accumulation of damage in the sample, and intact parent molecular ions are sputtered even after prolonged ion bombardment (i.e. primary ion doses >1 × 1016 ions/cm2). This saturation process allows molecular images to be obtained at high primary ion doses and allows depth profiles to be obtained from simple molecular solid/metal test structures.

Original languageEnglish (US)
Pages (from-to)2122-2130
Number of pages9
JournalAnalytical Chemistry
Volume62
Issue number19
StatePublished - Oct 1 1990

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Secondary ion mass spectrometry
Organic compounds
Ions
Imaging techniques
Ion microscopes
Polycyclic Aromatic Hydrocarbons
Ion bombardment
Ammonium Compounds
Imaging systems
Dosimetry
Copper
Anodes
Electron microscopes
Salts
Metals
Amino Acids
Molecules

ASJC Scopus subject areas

  • Analytical Chemistry

Cite this

Molecular ion imaging and dynamic secondary ion mass spectrometry of organic compounds. / Gillen, Greg; Simons, David S.; Williams, Peter.

In: Analytical Chemistry, Vol. 62, No. 19, 01.10.1990, p. 2122-2130.

Research output: Contribution to journalArticle

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