Modulated nanostructure characterization using aberration corrected STEM

Ray Carpenter, Ronit Sawant, Toshihiro Aoki

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
JournalMicroscopy and Microanalysis
DOIs
StateAccepted/In press - 2020
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

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