Modifications of competitive group testing

D. Z. Du, Guoliang Xue, S. N. Sun, S. W. Cheng

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

Many fault-detection problems fall into the following model: There is a set of n items, some of which are defective. The goal is to identify the defective items by using the minimum number of tests. Each test is on a subset of items and tells whether the subset contains a defective item or not. Let Malpha(d,n)(Malpha(d/ n)) denote the maximum number of tests for an algorithm α to identify d defectives from a set of n items provided that d, the number of defective items, is known (unknown) before the testing.

Original languageEnglish (US)
Pages (from-to)82-96
Number of pages15
JournalSIAM Journal on Computing
Volume23
Issue number1
StatePublished - Feb 1994
Externally publishedYes

Fingerprint

Group Testing
Fault detection
Testing
Subset
Fault Detection
Denote
Unknown
Model

ASJC Scopus subject areas

  • Computational Theory and Mathematics
  • Applied Mathematics
  • Theoretical Computer Science

Cite this

Du, D. Z., Xue, G., Sun, S. N., & Cheng, S. W. (1994). Modifications of competitive group testing. SIAM Journal on Computing, 23(1), 82-96.

Modifications of competitive group testing. / Du, D. Z.; Xue, Guoliang; Sun, S. N.; Cheng, S. W.

In: SIAM Journal on Computing, Vol. 23, No. 1, 02.1994, p. 82-96.

Research output: Contribution to journalArticle

Du, DZ, Xue, G, Sun, SN & Cheng, SW 1994, 'Modifications of competitive group testing', SIAM Journal on Computing, vol. 23, no. 1, pp. 82-96.
Du DZ, Xue G, Sun SN, Cheng SW. Modifications of competitive group testing. SIAM Journal on Computing. 1994 Feb;23(1):82-96.
Du, D. Z. ; Xue, Guoliang ; Sun, S. N. ; Cheng, S. W. / Modifications of competitive group testing. In: SIAM Journal on Computing. 1994 ; Vol. 23, No. 1. pp. 82-96.
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