Modifications of competitive group testing

D. Z. Du, G. L. Xue, S. N. Sun, S. W. Cheng

Research output: Contribution to journalArticlepeer-review

25 Scopus citations

Abstract

Many fault-detection problems fall into the following model: There is a set of n items, some of which are defective. The goal is to identify the defective items by using the minimum number of tests. Each test is on a subset of items and tells whether the subset contains a defective item or not. Let Malpha(d,n)(Malpha(d/ n)) denote the maximum number of tests for an algorithm α to identify d defectives from a set of n items provided that d, the number of defective items, is known (unknown) before the testing.

Original languageEnglish (US)
Pages (from-to)82-96
Number of pages15
JournalSIAM Journal on Computing
Volume23
Issue number1
DOIs
StatePublished - 1994
Externally publishedYes

ASJC Scopus subject areas

  • Computer Science(all)
  • Mathematics(all)

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