Modifications of competitive group testing

D. Z. Du; G. L. Xue; S. N. Sun; S. W. Cheng

doi:10.1137/S0097539792227612

Modifications of competitive group testing

D. Z. Du, G. L. Xue, S. N. Sun, S. W. Cheng

Research output: Contribution to journal › Article › peer-review

30 Scopus citations

Abstract

Many fault-detection problems fall into the following model: There is a set of n items, some of which are defective. The goal is to identify the defective items by using the minimum number of tests. Each test is on a subset of items and tells whether the subset contains a defective item or not. Let M_alpha(d,n)(M_alpha(d/ n)) denote the maximum number of tests for an algorithm α to identify d defectives from a set of n items provided that d, the number of defective items, is known (unknown) before the testing.

Original language	English (US)
Pages (from-to)	82-96
Number of pages	15
Journal	SIAM Journal on Computing
Volume	23
Issue number	1
DOIs	https://doi.org/10.1137/S0097539792227612
State	Published - 1994
Externally published	Yes

ASJC Scopus subject areas

General Computer Science
General Mathematics

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year = "1994",

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Modifications of competitive group testing

Abstract

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