Moderated degradation enhancement of lateral pnp transistors due to measurement bias

S. C. Witczak, R. D. Schrimpf, H. J. Barnaby, R. C. Lacoe, D. C. Mayer, K. F. Galloway, R. L. Pease, D. M. Fleetwood

Research output: Contribution to journal › Article › peer-review