Modelling Cross-section Current Collection in Cu-Doped CdTe using PyCDTS

Niranjana Mohan Kumar, Trumann Walker, Tara Nietzold, Michael Stuckelberger, Eric Colegrove, Barry Lai, Abdul R. Shaik, Mariana Bertoni

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Copper is a traditional dopant for many types of polycrystalline thin-film CdTe photovoltaic devices. However, Cu can easily distribute through the depth and breadth of the device, segregating at interfaces or grain boundaries and leading to metastability of the device. Directly correlating Cu-related defect species to the local (i.e. nanoscale) charge transport in CdTe devices remains challenging due to relatively low Cu concentrations in the CdTe layer. Using nanoscale X-ray microscopy, we simultaneously probe both the elemental copper distribution and electrical performance of the device in cross-section. Complementary charge transport modelling delineates the possible defect distributions that can exist under low and high Cu loading, and how these defects interact with charge carriers at different depths of the device.

Original languageEnglish (US)
Title of host publication2021 IEEE 48th Photovoltaic Specialists Conference, PVSC 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2124-2127
Number of pages4
ISBN (Electronic)9781665419222
DOIs
StatePublished - Jun 20 2021
Event48th IEEE Photovoltaic Specialists Conference, PVSC 2021 - Fort Lauderdale, United States
Duration: Jun 20 2021Jun 25 2021

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371

Conference

Conference48th IEEE Photovoltaic Specialists Conference, PVSC 2021
Country/TerritoryUnited States
CityFort Lauderdale
Period6/20/216/25/21

Keywords

  • CdTe
  • diffusion length
  • modeling
  • thin-film solar cells
  • XBIC

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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