@inproceedings{7e7a7e4974fc4a989f894a901fed5f78,
title = "Modeling Time to Failure in Potential-Induced Degradation of Silicon Solar Modules based on Quantitative Sodium Kinetics",
abstract = "We present a physics-based simulation environment for the prediction of potential-induced-degradation (PID) failure time in silicon solar modules. Our model is based on experimental sodium migration kinetics obtained from our recently developed trap-corrected bias-stress-temperature method and from secondary ion mass spectrometry measurements. We model sodium migration to stacking faults and subsequent formation of conductive pathways through the p-n junction, which causes a decrease of the shunt resistance and loss of efficiency.",
keywords = "Potential-induced-degradation, shunt, silicon, sodium",
author = "{Von Gastrow}, Guillaume and {Martinez Loran}, Erick and Jacob Clenney and Rico Meier and {Ochoa Bueno}, Jorge and Bertoni, {Mariana I.} and Fenning, {David P.}",
note = "Funding Information: This work was supported by the U.S. Department of Energy{\textquoteright}s Office of Energy Efficiency and Renewable Energy under Solar Energy Technologies Office Agreement Number DE-EE0007751. E. Martinez-Loran thanks CONACyT and UC MEXUS for his doctoral fellowship. Publisher Copyright: {\textcopyright} 2020 IEEE.; 47th IEEE Photovoltaic Specialists Conference, PVSC 2020 ; Conference date: 15-06-2020 Through 21-08-2020",
year = "2020",
month = jun,
day = "14",
doi = "10.1109/PVSC45281.2020.9300664",
language = "English (US)",
series = "Conference Record of the IEEE Photovoltaic Specialists Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "2207--2209",
booktitle = "2020 47th IEEE Photovoltaic Specialists Conference, PVSC 2020",
}