Modeling the effects of hydrogen on the mechanisms of dose rate sensitivity

Ivan S. Esqueda, Hugh Barnaby, Philippe C. Adell

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The effects of hydrogen on dose-rate sensitivity are simulated using a one-dimensional (1-D) model that incorporates the physical mechanisms contributing to dose-rate effects in metal-oxide-semiconductor (MOS) structures. Calculations show that molecular hydrogen cracking at positively charged defects may be a key reaction relating hydrogen and dose rate response. Comparison to experimental data on bipolar devices results in good agreement with the dose rate calculations of interface trap buildup.

Original languageEnglish (US)
Title of host publicationProceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS
Pages1-6
Number of pages6
DOIs
StatePublished - 2011
Event12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011 - Sevilla, Spain
Duration: Sep 19 2011Sep 23 2011

Other

Other12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011
CountrySpain
CitySevilla
Period9/19/119/23/11

Fingerprint

dosage
Hydrogen
hydrogen
metal oxide semiconductors
Defects
traps
Metals
defects
Oxide semiconductors

Keywords

  • bipolar
  • Dose rate
  • ELDRS
  • hydrogen
  • interface traps
  • metal-oxide-semiconductor (MOS)
  • silicon dioxide
  • total ionizing dose (TID)

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Radiation

Cite this

Esqueda, I. S., Barnaby, H., & Adell, P. C. (2011). Modeling the effects of hydrogen on the mechanisms of dose rate sensitivity. In Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS (pp. 1-6). [6131290] https://doi.org/10.1109/RADECS.2011.6131290

Modeling the effects of hydrogen on the mechanisms of dose rate sensitivity. / Esqueda, Ivan S.; Barnaby, Hugh; Adell, Philippe C.

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS. 2011. p. 1-6 6131290.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Esqueda, IS, Barnaby, H & Adell, PC 2011, Modeling the effects of hydrogen on the mechanisms of dose rate sensitivity. in Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS., 6131290, pp. 1-6, 12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011, Sevilla, Spain, 9/19/11. https://doi.org/10.1109/RADECS.2011.6131290
Esqueda IS, Barnaby H, Adell PC. Modeling the effects of hydrogen on the mechanisms of dose rate sensitivity. In Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS. 2011. p. 1-6. 6131290 https://doi.org/10.1109/RADECS.2011.6131290
Esqueda, Ivan S. ; Barnaby, Hugh ; Adell, Philippe C. / Modeling the effects of hydrogen on the mechanisms of dose rate sensitivity. Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS. 2011. pp. 1-6
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