Modeling radiation-induced degradation in top-gated epitaxial graphene field-effect-transistors (Fets)

Ivan S. Esqueda, Cory D. Cress, Travis J. Anderson, Jonathan R. Ahlbin, Michael Bajura, Michael Fritze, Jeong S. Moon

Research output: Contribution to journalArticlepeer-review

6 Scopus citations

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Engineering & Materials Science