Modeling of multilayered C-block actuators

Aditi Chattopadhyay, Lori A. Mitchell, Haozhong Gu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

A new class of bimorph actuators, called C-block actuators for their curved shape, have recently been proposed to provide improved performance characteristics over conventional straight bimorph actuators. Existing mathematical models of these actuators are based on classical curved beam theory which neglects transverse shear effects. An improved mathematical model for C-block actuators of arbitrary thickness is developed. The first order shear deformation based theory model accounts for through-the-thickness transverse shear stresses in thick piezoelectric C-block actuators. The results obtained from the first order shear deformation theory are validated with results from finite element analysis, available experimental data and an exact elasticity solution. The developed theory is used to predict the performance of multilayered C-block actuators of various configurations to demonstrate the importance of shear effects.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Pages647-658
Number of pages12
Volume3329
DOIs
StatePublished - 1998
EventSmart Structures and Materials 1998: Smart Structures and Integrated Systems - San Diego, CA, United States
Duration: Feb 3 1998Feb 3 1998

Other

OtherSmart Structures and Materials 1998: Smart Structures and Integrated Systems
CountryUnited States
CitySan Diego, CA
Period2/3/982/3/98

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Keywords

  • Modeling
  • Piezoelectric C-block actuators
  • Transverse shear effects

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Chattopadhyay, A., Mitchell, L. A., & Gu, H. (1998). Modeling of multilayered C-block actuators. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3329, pp. 647-658) https://doi.org/10.1117/12.316933