Modeling of damage accumulation for Duffing-type systems under severe random excitations

B. Yang, Marc Mignolet, S. M. Spottswood

Research output: Contribution to journalConference article

8 Scopus citations

Abstract

The focus of this investigation is on the prediction of the fatigue life of aircraft panels subjected to thermal effects and a severe random acoustic excitation. The prototypical equations for this problem, i.e. the single and double well Duffing oscillators subjected to a bandlimited white noise, are first considered. A review of some currently available approaches, i.e. the Rayleigh approximation and the single spectral moment method both with and without Gaussianity correction, strongly suggests that an accurate prediction of the fatigue life for this non-linear system requires a dedicated model. To this end, an approximation of the probability density function of the peaks of the stationary response of the Duffing oscillators is derived. This model is then used in conjunction with either a narrowband assumption or the single spectral moment methodology to yield a prediction of the fatigue life. The application of this approach to simulation data from both single and double well Duffing oscillators, as well as on the experimental response of an unbuckled panel, demonstrates the reliability of this novel approximation.

Original languageEnglish (US)
Pages (from-to)185-194
Number of pages10
JournalProbabilistic Engineering Mechanics
Volume19
Issue number1
DOIs
StatePublished - Jan 1 2004
EventFourth International Conference on Computational Stochastic - Corfu, Greece
Duration: Jun 9 2002Jun 13 2002

Keywords

  • Aircraft panels
  • Buckled panels
  • Duffing equations
  • Fatigue life
  • Peaks distribution

ASJC Scopus subject areas

  • Statistical and Nonlinear Physics
  • Civil and Structural Engineering
  • Nuclear Energy and Engineering
  • Condensed Matter Physics
  • Aerospace Engineering
  • Ocean Engineering
  • Mechanical Engineering

Fingerprint Dive into the research topics of 'Modeling of damage accumulation for Duffing-type systems under severe random excitations'. Together they form a unique fingerprint.

  • Cite this