Modeling bjt radiation response with non-uniform energy distributions of interface traps

Hugh Barnaby, C. Cirba, R. D. Schrimpf, S. L. Rosier, P. Fouillat, X. Montagner

Research output: Contribution to journalArticle

11 Citations (Scopus)

Abstract

Radiation-induced oxide defects that degrade electrical characteristics of BJTs can be measured with the use of gated diodes. The buildup of defects and their effect on device radiation response are modeled with computer simulation.

Original languageEnglish (US)
Pages (from-to)514-518
Number of pages5
JournalIEEE Transactions on Nuclear Science
Volume47
Issue number3 PART 1
StatePublished - 2000
Externally publishedYes

Fingerprint

energy distribution
traps
Radiation
Defects
defects
radiation
Diodes
computerized simulation
diodes
Oxides
oxides
Computer simulation

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Nuclear Energy and Engineering

Cite this

Barnaby, H., Cirba, C., Schrimpf, R. D., Rosier, S. L., Fouillat, P., & Montagner, X. (2000). Modeling bjt radiation response with non-uniform energy distributions of interface traps. IEEE Transactions on Nuclear Science, 47(3 PART 1), 514-518.

Modeling bjt radiation response with non-uniform energy distributions of interface traps. / Barnaby, Hugh; Cirba, C.; Schrimpf, R. D.; Rosier, S. L.; Fouillat, P.; Montagner, X.

In: IEEE Transactions on Nuclear Science, Vol. 47, No. 3 PART 1, 2000, p. 514-518.

Research output: Contribution to journalArticle

Barnaby, H, Cirba, C, Schrimpf, RD, Rosier, SL, Fouillat, P & Montagner, X 2000, 'Modeling bjt radiation response with non-uniform energy distributions of interface traps', IEEE Transactions on Nuclear Science, vol. 47, no. 3 PART 1, pp. 514-518.
Barnaby H, Cirba C, Schrimpf RD, Rosier SL, Fouillat P, Montagner X. Modeling bjt radiation response with non-uniform energy distributions of interface traps. IEEE Transactions on Nuclear Science. 2000;47(3 PART 1):514-518.
Barnaby, Hugh ; Cirba, C. ; Schrimpf, R. D. ; Rosier, S. L. ; Fouillat, P. ; Montagner, X. / Modeling bjt radiation response with non-uniform energy distributions of interface traps. In: IEEE Transactions on Nuclear Science. 2000 ; Vol. 47, No. 3 PART 1. pp. 514-518.
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