Modeling and investigations on TID-ASETs synergistic effect in LM124 Operational amplifier from three different manufacturers

Fabien Roig, L. Dusseau, A. Khachatrian, N. J.H. Roche, A. Privat, J. R. Vaille, J. Boch, J. H. Warner, F. Saigne, S. P. Buchner, D. McMorrow, P. Ribeiro, G. Auriel, B. Azais, R. Marec, P. Calvel, F. Bezerra, R. Ecoffet

Research output: Contribution to journalArticlepeer-review

23 Scopus citations

Abstract

The synergistic effect between Total Ionizing Dose (TID) and Analog Single Event Transient (ASET) in LM124 operational amplifiers (opamps) from three different manufacturers is investigated. This effect is clearly identified on only two manufacturers by three, highlighting manufacturer dependent. In fact, significant variations were observed on both the TID sensitivity and the ASET response of LM124 devices from different manufacturers. Hypotheses are made on the cause of the differences observed. A previously developed ASET simulation tool is used to model the transient response. The effects of TID on devices are taken into account in the model by injecting the variations of key electrical parameters obtained during Co$60 irradiation. An excellent agreement is observed between the experimental responses and the model outputs, independently of the TID level, the bias configuration and the manufacturer of the device.

Original languageEnglish (US)
Article number6636097
Pages (from-to)4430-4438
Number of pages9
JournalIEEE Transactions on Nuclear Science
Volume60
Issue number6
DOIs
StatePublished - Dec 2013
Externally publishedYes

Keywords

  • Bipolar analog integrated circuits
  • circuit modeling
  • ionizing dose
  • single event transient
  • transient response

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering
  • Electrical and Electronic Engineering

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