Modeling and investigations on TID-ASETs synergistic effect in LM124 Operational amplifier from three different manufacturers

Fabien Roig; L. Dusseau; A. Khachatrian; N. J.H. Roche; A. Privat; J. R. Vaille; J. Boch; J. H. Warner; F. Saigne; S. P. Buchner; D. McMorrow; P. Ribeiro; G. Auriel; B. Azais; R. Marec; P. Calvel; F. Bezerra; R. Ecoffet

doi:10.1109/TNS.2013.2280294

Modeling and investigations on TID-ASETs synergistic effect in LM124 Operational amplifier from three different manufacturers

Fabien Roig, L. Dusseau, A. Khachatrian, N. J.H. Roche, A. Privat, J. R. Vaille, J. Boch, J. H. Warner, F. Saigne, S. P. Buchner, D. McMorrow, P. Ribeiro, G. Auriel, B. Azais, R. Marec, P. Calvel, F. Bezerra, R. Ecoffet

Research output: Contribution to journal › Article › peer-review

28 Scopus citations

Abstract

The synergistic effect between Total Ionizing Dose (TID) and Analog Single Event Transient (ASET) in LM124 operational amplifiers (opamps) from three different manufacturers is investigated. This effect is clearly identified on only two manufacturers by three, highlighting manufacturer dependent. In fact, significant variations were observed on both the TID sensitivity and the ASET response of LM124 devices from different manufacturers. Hypotheses are made on the cause of the differences observed. A previously developed ASET simulation tool is used to model the transient response. The effects of TID on devices are taken into account in the model by injecting the variations of key electrical parameters obtained during Co$⁶⁰ irradiation. An excellent agreement is observed between the experimental responses and the model outputs, independently of the TID level, the bias configuration and the manufacturer of the device.

Original language	English (US)
Article number	6636097
Pages (from-to)	4430-4438
Number of pages	9
Journal	IEEE Transactions on Nuclear Science
Volume	60
Issue number	6
DOIs	https://doi.org/10.1109/TNS.2013.2280294
State	Published - Dec 2013
Externally published	Yes

Keywords

Bipolar analog integrated circuits
circuit modeling
ionizing dose
single event transient
transient response

ASJC Scopus subject areas

Nuclear and High Energy Physics
Nuclear Energy and Engineering
Electrical and Electronic Engineering

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10.1109/TNS.2013.2280294

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Roig, F., Dusseau, L., Khachatrian, A., Roche, N. J. H., Privat, A., Vaille, J. R., Boch, J., Warner, J. H., Saigne, F., Buchner, S. P., McMorrow, D., Ribeiro, P., Auriel, G., Azais, B., Marec, R., Calvel, P., Bezerra, F., & Ecoffet, R. (2013). Modeling and investigations on TID-ASETs synergistic effect in LM124 Operational amplifier from three different manufacturers. IEEE Transactions on Nuclear Science, 60(6), 4430-4438. Article 6636097. https://doi.org/10.1109/TNS.2013.2280294

Roig, F, Dusseau, L, Khachatrian, A, Roche, NJH, Privat, A, Vaille, JR, Boch, J, Warner, JH, Saigne, F, Buchner, SP, McMorrow, D, Ribeiro, P, Auriel, G, Azais, B, Marec, R, Calvel, P, Bezerra, F & Ecoffet, R 2013, 'Modeling and investigations on TID-ASETs synergistic effect in LM124 Operational amplifier from three different manufacturers', IEEE Transactions on Nuclear Science, vol. 60, no. 6, 6636097, pp. 4430-4438. https://doi.org/10.1109/TNS.2013.2280294

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title = "Modeling and investigations on TID-ASETs synergistic effect in LM124 Operational amplifier from three different manufacturers",

abstract = "The synergistic effect between Total Ionizing Dose (TID) and Analog Single Event Transient (ASET) in LM124 operational amplifiers (opamps) from three different manufacturers is investigated. This effect is clearly identified on only two manufacturers by three, highlighting manufacturer dependent. In fact, significant variations were observed on both the TID sensitivity and the ASET response of LM124 devices from different manufacturers. Hypotheses are made on the cause of the differences observed. A previously developed ASET simulation tool is used to model the transient response. The effects of TID on devices are taken into account in the model by injecting the variations of key electrical parameters obtained during Co$60 irradiation. An excellent agreement is observed between the experimental responses and the model outputs, independently of the TID level, the bias configuration and the manufacturer of the device.",

keywords = "Bipolar analog integrated circuits, circuit modeling, ionizing dose, single event transient, transient response",

author = "Fabien Roig and L. Dusseau and A. Khachatrian and Roche, {N. J.H.} and A. Privat and Vaille, {J. R.} and J. Boch and Warner, {J. H.} and F. Saigne and Buchner, {S. P.} and D. McMorrow and P. Ribeiro and G. Auriel and B. Azais and R. Marec and P. Calvel and F. Bezerra and R. Ecoffet",

year = "2013",

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doi = "10.1109/TNS.2013.2280294",

language = "English (US)",

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AU - Roig, Fabien

AU - Dusseau, L.

AU - Khachatrian, A.

AU - Roche, N. J.H.

AU - Privat, A.

AU - Vaille, J. R.

AU - Boch, J.

AU - Warner, J. H.

AU - Saigne, F.

AU - Buchner, S. P.

AU - McMorrow, D.

AU - Ribeiro, P.

AU - Auriel, G.

AU - Azais, B.

AU - Marec, R.

AU - Calvel, P.

AU - Bezerra, F.

AU - Ecoffet, R.

PY - 2013/12

Y1 - 2013/12

N2 - The synergistic effect between Total Ionizing Dose (TID) and Analog Single Event Transient (ASET) in LM124 operational amplifiers (opamps) from three different manufacturers is investigated. This effect is clearly identified on only two manufacturers by three, highlighting manufacturer dependent. In fact, significant variations were observed on both the TID sensitivity and the ASET response of LM124 devices from different manufacturers. Hypotheses are made on the cause of the differences observed. A previously developed ASET simulation tool is used to model the transient response. The effects of TID on devices are taken into account in the model by injecting the variations of key electrical parameters obtained during Co$60 irradiation. An excellent agreement is observed between the experimental responses and the model outputs, independently of the TID level, the bias configuration and the manufacturer of the device.

AB - The synergistic effect between Total Ionizing Dose (TID) and Analog Single Event Transient (ASET) in LM124 operational amplifiers (opamps) from three different manufacturers is investigated. This effect is clearly identified on only two manufacturers by three, highlighting manufacturer dependent. In fact, significant variations were observed on both the TID sensitivity and the ASET response of LM124 devices from different manufacturers. Hypotheses are made on the cause of the differences observed. A previously developed ASET simulation tool is used to model the transient response. The effects of TID on devices are taken into account in the model by injecting the variations of key electrical parameters obtained during Co$60 irradiation. An excellent agreement is observed between the experimental responses and the model outputs, independently of the TID level, the bias configuration and the manufacturer of the device.

KW - Bipolar analog integrated circuits

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KW - ionizing dose

KW - single event transient

KW - transient response

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Modeling and investigations on TID-ASETs synergistic effect in LM124 Operational amplifier from three different manufacturers

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Keywords

ASJC Scopus subject areas

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