We present a framework to model and characterize the microstructure of heterogeneous materials with anisotropic inclusions of secondary phases based on the directional correlation functions of the inclusions. Specifically, we have devised an efficient method to incorporate both directional two-point correlation functions S2 and directional two-point cluster functions C2 that contain non-trivial topological connectedness information into the simulated annealing microstructure reconstruction procedure. Our framework is applied to model an anisotropic aluminum alloy and the accuracy of the reconstructed structural models is assessed by quantitative comparison with the actual microstructure obtained via x-ray tomography. We show that incorporation of directional clustering information via C2 significantly improves the accuracy of the reconstruction. In addition, a set of analytical "basis" correlation functions are introduced to approximate the actual S2 and C2 of the material. With the proper choice of basis functions, the anisotropic microstructure can be represented by a handful of parameters including the effective linear sizes of the iron-rich and silicon-rich inclusions along three orthogonal directions. This provides a general and efficient means for heterogeneous material modeling that enables one to significantly reduce the data set required to characterize the anisotropic microstructure.
|Original language||English (US)|
|Journal||Journal of Applied Physics|
|State||Published - Mar 7 2014|
ASJC Scopus subject areas
- Physics and Astronomy(all)