@inproceedings{344a48459c23498caf37c97029268111,
title = "Mitigation of PID in commercial PV modules using current interruption method",
abstract = "Potential-induced degradation (PID) is known to have a very severe effect on the reliability of PV modules. PID is caused due to the leakage of current from the cell circuit to the grounded frame under humid conditions of high voltage photovoltaic (PV) systems. There are multiple paths for the current leakage. The most dominant leakage path is from the cell to the frame through encapsulant, glass bulk and glass surface. This dominant path can be prevented by interrupting the electrical conductivity at the glass surface. In our previous works related to this topic, we demonstrated the effectiveness of glass surface conductivity interruption technique using one-cell PV coupons. In this work, we demonstrate the effectiveness of this technique using a full size commercial module susceptible to PID. The interruption of surface conductivity of the commercial module was achieved by attaching a narrow, thin flexible glass strips, from Corning, called Willow Glass on the glass surface along the inner edges of the frame. The flexible glass strip was attached to the module glass surface by heating the glass strip with an ionomer adhesive underneath using a handheld heat gun. The PID stress test was performed at 60°C and 85% RH for 96 hours at {\^a}'600 V. Pre-and post-PID characterizations including I-V and electroluminescence were carried out to determine the performance loss and affected cell areas. This work demonstrates that the PID issue can be effectively addressed by using this current interruption technique. An important benefit of this approach is that this interruption technique can be applied after manufacturing the modules and after installing the modules in the field as well.",
keywords = "Durability, Ionomer, PID, Potential induced degradation, Reliability, Willow Glass",
author = "Birinchi Bora and Jaewon Oh and Sai Tatapudi and Sastry, {Oruganty S.} and Rajesh Kumar and Basudev Prasad and Govindasamy TamizhMani",
note = "Funding Information: This research is based upon work supported by the Solar Energy Research Institute for India and the U.S. (SERIIUS) funded jointly by the U.S. Department of Energy subcontract DE AC36-08G028308 (Office of Science, Office of Basic Energy Sciences, and Energy Efficiency and Renewable Energy, Solar Energy Technology Program, with support from the Office of International Affairs) and the Government of India subcontract IUSSTF/JCERDC-SERIIUS/2012 dated 22nd Nov. 2012. We would like to sincerely thank Sean Garner of Corning for supplying the flexible Willow{\textregistered} Glass strips used in this project. Publisher Copyright: {\textcopyright} COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.; Reliability of Photovoltaic Cells, Modules, Components, and Systems X 2017 ; Conference date: 06-08-2017 Through 07-08-2017",
year = "2017",
doi = "10.1117/12.2281112",
language = "English (US)",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Kempe, {Michael D.} and Dhere, {Neelkanth G.} and Keiichiro Sakurai",
booktitle = "Reliability of Photovoltaic Cells, Modules, Components, and Systems X",
}