Mitigating the effect of reliability soft-errors of RRAM devices on the performance of RRAM-based neuromorphic systems

Amr M.S. Tosson, Shimeng Yu, Mohab Anis, Lan Wei

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

With the speed and power bottleneck in the conventional Von Neumann architecture, the interest in the neuromorphic systems has greatly increased in recent years. To create a highly dense communication network between the preand post-neurons, RRAM devices are used as synapses in the neuromorphic systems due to many advantages including their small sizes and low-power operations. However, due to RRAM reliability issues, in particular soft-errors, the performance of the RRAM-based neuromorphic systems are significantly degraded. In this article, we propose a novel framework for detecting and resolving the degradation in the system performance due to the RRAM reliability soft-errors. The read and write circuits modifications to implement the framework, and their impact on the delay and energy consumption of the neuromorphic system are also discussed in this article. Using a combination of BRIAN and SPICE simulations, we demonstrate that the proposed framework can restore the accuracy of the example RRAM-based neuromorphic system from 43% back to its target value of 91.6% with a minimal impact on the read (< 0.1% and 1.1% increase in the delay and energy respectively) and write (0% and < 0.1% increase in the delay and energy respectively) operations.

Original languageEnglish (US)
Title of host publicationGLSVLSI 2017 - Proceedings of the Great Lakes Symposium on VLSI 2017
PublisherAssociation for Computing Machinery
Pages53-58
Number of pages6
VolumePart F127756
ISBN (Electronic)9781450349727
DOIs
StatePublished - May 10 2017
Event27th Great Lakes Symposium on VLSI, GLSVLSI 2017 - Banff, Canada
Duration: May 10 2017May 12 2017

Other

Other27th Great Lakes Symposium on VLSI, GLSVLSI 2017
CountryCanada
CityBanff
Period5/10/175/12/17

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ASJC Scopus subject areas

  • Engineering(all)

Cite this

Tosson, A. M. S., Yu, S., Anis, M., & Wei, L. (2017). Mitigating the effect of reliability soft-errors of RRAM devices on the performance of RRAM-based neuromorphic systems. In GLSVLSI 2017 - Proceedings of the Great Lakes Symposium on VLSI 2017 (Vol. Part F127756, pp. 53-58). Association for Computing Machinery. https://doi.org/10.1145/3060403.3060431