Miniaturization of the Thermal Emission Spectrometer (TES) electronics for the Mars 2001 Lander

Bruce Lewis, James Jeter, Steven Silverman, Duane Bates, Philip Christensen, Greg Mehall, Rolph Keehn

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper will describe the miniaturization of the Thermal Emission Spectrometer (TES) electronic system for use in the Miniature-TES (Mini-TES) being built for Arizona State University. Mini-TES will be used to measure thermal emission for mapping of surface minerals on Mars. Mini-TES is a single pixel, Fourier Transform Spectrometer, covering 5-28 μm at 10 cm -1 resolution. The Mini-TES electronics incorporate modern Field Programmable Gate Array (FPGA) technology, surface mount designs, and simplified command, control and data protocol allowing for a 4 fold reduction in the electronics subsystem. Use of the Lander computer for shared signal processing further help to reduce the Mini-TES complexity. Details of the space flight hardware design, actual hardware fabrication and initial test results will be discussed.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers
Pages555-563
Number of pages9
Volume3756
StatePublished - 1999
Externally publishedYes
EventProceedings of the 1999 Optical Spectroscopic Techniques and Instrumentation for Atmospheric and Space Research III - Denver, CO, USA
Duration: Jul 19 1999Jul 21 1999

Other

OtherProceedings of the 1999 Optical Spectroscopic Techniques and Instrumentation for Atmospheric and Space Research III
CityDenver, CO, USA
Period7/19/997/21/99

Fingerprint

miniaturization
thermal emission
mars
Spectrometers
Electronic equipment
spectrometers
hardware
electronics
command and control
Hardware
field-programmable gate arrays
Surface mount technology
space flight
Space flight
Field programmable gate arrays (FPGA)
signal processing
Fourier transforms
Signal processing
coverings
Minerals

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

Cite this

Lewis, B., Jeter, J., Silverman, S., Bates, D., Christensen, P., Mehall, G., & Keehn, R. (1999). Miniaturization of the Thermal Emission Spectrometer (TES) electronics for the Mars 2001 Lander. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 3756, pp. 555-563). Society of Photo-Optical Instrumentation Engineers.

Miniaturization of the Thermal Emission Spectrometer (TES) electronics for the Mars 2001 Lander. / Lewis, Bruce; Jeter, James; Silverman, Steven; Bates, Duane; Christensen, Philip; Mehall, Greg; Keehn, Rolph.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3756 Society of Photo-Optical Instrumentation Engineers, 1999. p. 555-563.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Lewis, B, Jeter, J, Silverman, S, Bates, D, Christensen, P, Mehall, G & Keehn, R 1999, Miniaturization of the Thermal Emission Spectrometer (TES) electronics for the Mars 2001 Lander. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 3756, Society of Photo-Optical Instrumentation Engineers, pp. 555-563, Proceedings of the 1999 Optical Spectroscopic Techniques and Instrumentation for Atmospheric and Space Research III, Denver, CO, USA, 7/19/99.
Lewis B, Jeter J, Silverman S, Bates D, Christensen P, Mehall G et al. Miniaturization of the Thermal Emission Spectrometer (TES) electronics for the Mars 2001 Lander. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3756. Society of Photo-Optical Instrumentation Engineers. 1999. p. 555-563
Lewis, Bruce ; Jeter, James ; Silverman, Steven ; Bates, Duane ; Christensen, Philip ; Mehall, Greg ; Keehn, Rolph. / Miniaturization of the Thermal Emission Spectrometer (TES) electronics for the Mars 2001 Lander. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 3756 Society of Photo-Optical Instrumentation Engineers, 1999. pp. 555-563
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