1 Citation (Scopus)

Abstract

Microwave heating has been used to decrease the time required for exfoliation of thin single-crystalline silicon layers onto insulator substrates using ion-cut processing. Samples exfoliated in a 2.45 GHz, 1300 W cavity applicator microwave system saw a decrease in incubation times as compared to conventional anneal processes. Rutherford backscattering spectrometry, cross sectional scanning electron microscopy, cross sectional transmission electron microscopy, and selective aperture electron diffraction were used to determine the transferred layer thickness and crystalline quality. The surface quality was determined by atomic force microscopy. Hall measurements were used to determine electrical properties as a function of radiation repair anneal times. Results of physical and electrical characterizations demonstrate that the end products of microwave enhanced ion-cut processing do not appreciably differ from those using more traditional means of exfoliation.

Original languageEnglish (US)
Article number114915
JournalJournal of Applied Physics
Volume101
Issue number11
DOIs
StatePublished - 2007

Fingerprint

microwaves
silicon
ions
backscattering
electron diffraction
apertures
electrical properties
insulators
atomic force microscopy
transmission electron microscopy
cavities
scanning electron microscopy
heating
radiation
products
spectroscopy

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

Cite this

Thompson, D. C., Alford, T., Mayer, J. W., Höchbauer, T., Lee, J. K., Nastasi, M., ... Chu, P. K. (2007). Microwave enhanced ion-cut silicon layer transfer. Journal of Applied Physics, 101(11), [114915]. https://doi.org/10.1063/1.2737387

Microwave enhanced ion-cut silicon layer transfer. / Thompson, D. C.; Alford, Terry; Mayer, J. W.; Höchbauer, T.; Lee, J. K.; Nastasi, M.; Lau, S. S.; Theodore, N. David; Chu, Paul K.

In: Journal of Applied Physics, Vol. 101, No. 11, 114915, 2007.

Research output: Contribution to journalArticle

Thompson, DC, Alford, T, Mayer, JW, Höchbauer, T, Lee, JK, Nastasi, M, Lau, SS, Theodore, ND & Chu, PK 2007, 'Microwave enhanced ion-cut silicon layer transfer', Journal of Applied Physics, vol. 101, no. 11, 114915. https://doi.org/10.1063/1.2737387
Thompson DC, Alford T, Mayer JW, Höchbauer T, Lee JK, Nastasi M et al. Microwave enhanced ion-cut silicon layer transfer. Journal of Applied Physics. 2007;101(11). 114915. https://doi.org/10.1063/1.2737387
Thompson, D. C. ; Alford, Terry ; Mayer, J. W. ; Höchbauer, T. ; Lee, J. K. ; Nastasi, M. ; Lau, S. S. ; Theodore, N. David ; Chu, Paul K. / Microwave enhanced ion-cut silicon layer transfer. In: Journal of Applied Physics. 2007 ; Vol. 101, No. 11.
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