Abstract
The issues related to Raman scattering characterization of the microstructure of diamond thin films are reviewed. The optical effects of the transparent/absorbing composite of sp 2/sp 3 bonded material is discussed. Then the depedence of the Raman spectra on the microcrystalline size is described. The comparison is made with crystalline Si, and the analysis is applied to a series a diamond films. Lastly micro-Raman scattering from the initial stages of diamon film growth are described, and the results are correlated with STM measurements of the nuclei. Surface enhanced Raman scattering is applied to examine the regions betwen diamond nuclei.
| Original language | English (US) |
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| Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
| Editors | David D. Saperstein |
| Publisher | Publ by Int Soc for Optical Engineering |
| Pages | 2-12 |
| Number of pages | 11 |
| Volume | 1437 |
| State | Published - 1991 |
| Externally published | Yes |
| Event | Applied Spectroscopy in Material Science - Los Angeles, CA, USA Duration: Jan 21 1991 → Jan 23 1991 |
Other
| Other | Applied Spectroscopy in Material Science |
|---|---|
| City | Los Angeles, CA, USA |
| Period | 1/21/91 → 1/23/91 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics