Microstructural characterization of InN/GaN multiple quantum wells

Lin Zhou, E. Dimakis, T. D. Moustakas, David Smith

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)256-257
Number of pages2
JournalMicroscopy and Microanalysis
Volume14
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 1 2008

ASJC Scopus subject areas

  • Instrumentation

Cite this