Microstructural characterization of HgTe/HgCdTe superlattices

T. Aoki; M. Takeguchi; P. Boieriu; R. Singh; C. Grein; David Smith

doi:10.1017/S1431927604882175

Microstructural characterization of HgTe/HgCdTe superlattices

T. Aoki, M. Takeguchi, P. Boieriu, R. Singh, C. Grein, David Smith

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	48-49
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	10
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927604882175
State	Published - 2004

ASJC Scopus subject areas

Instrumentation

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10.1017/S1431927604882175

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@article{178689e5a99c4ac2b6c4189204a5fe72,

title = "Microstructural characterization of HgTe/HgCdTe superlattices",

author = "T. Aoki and M. Takeguchi and P. Boieriu and R. Singh and C. Grein and David Smith",

note = "Funding Information: This work was partially supported by NASA Grant No. NAG5-10213. We acknowledge use of facilities in the John M. Cowley Center for High Resolution Electron Microscopy at ASU. M. Takeguchi acknowledges support from National Institute for Materials Science during sabbatical leave.",

year = "2004",

doi = "10.1017/S1431927604882175",

language = "English (US)",

volume = "10",

pages = "48--49",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - Microstructural characterization of HgTe/HgCdTe superlattices

AU - Aoki, T.

AU - Takeguchi, M.

AU - Boieriu, P.

AU - Singh, R.

AU - Grein, C.

AU - Smith, David

N1 - Funding Information: This work was partially supported by NASA Grant No. NAG5-10213. We acknowledge use of facilities in the John M. Cowley Center for High Resolution Electron Microscopy at ASU. M. Takeguchi acknowledges support from National Institute for Materials Science during sabbatical leave.

PY - 2004

Y1 - 2004

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U2 - 10.1017/S1431927604882175

DO - 10.1017/S1431927604882175

M3 - Article

AN - SCOPUS:4544229284

SN - 1431-9276

VL - 10

SP - 48

EP - 49

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -

Microstructural characterization of HgTe/HgCdTe superlattices

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