Microstructural and micromagnetic characterization of thin film magnetic tunnel junctions

R. E. Dunin-Borkowski, Martha McCartney, David Smith, S. Gider, B. U. Runge, S. S P Parkin

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

Combinations of high resolution electron microscopy, Lorentz microscopy, and off axis electron holography were used for the characterization of thin film magnetic tunnel junctions (MTJ). The MTJs contain CoPtCr hard ferromagnetic layers, alumina insulating barriers, and CoPt, Co, or NiFe soft ferromagnetic layers. The effect of annealing on the integrity of the alumina tunnel barrier were studied and the mechanism of magnetization decay of the hard layer following repeated reversal of the soft layers were addressed.

Original languageEnglish (US)
Pages (from-to)4815-4817
Number of pages3
JournalJournal of Applied Physics
Volume85
Issue number8 II A
StatePublished - Apr 15 1999

Fingerprint

tunnel junctions
thin films
aluminum oxides
holography
integrity
tunnels
electron microscopy
microscopy
magnetization
annealing
high resolution
decay
electrons

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

Cite this

Dunin-Borkowski, R. E., McCartney, M., Smith, D., Gider, S., Runge, B. U., & Parkin, S. S. P. (1999). Microstructural and micromagnetic characterization of thin film magnetic tunnel junctions. Journal of Applied Physics, 85(8 II A), 4815-4817.

Microstructural and micromagnetic characterization of thin film magnetic tunnel junctions. / Dunin-Borkowski, R. E.; McCartney, Martha; Smith, David; Gider, S.; Runge, B. U.; Parkin, S. S P.

In: Journal of Applied Physics, Vol. 85, No. 8 II A, 15.04.1999, p. 4815-4817.

Research output: Contribution to journalArticle

Dunin-Borkowski, RE, McCartney, M, Smith, D, Gider, S, Runge, BU & Parkin, SSP 1999, 'Microstructural and micromagnetic characterization of thin film magnetic tunnel junctions', Journal of Applied Physics, vol. 85, no. 8 II A, pp. 4815-4817.
Dunin-Borkowski, R. E. ; McCartney, Martha ; Smith, David ; Gider, S. ; Runge, B. U. ; Parkin, S. S P. / Microstructural and micromagnetic characterization of thin film magnetic tunnel junctions. In: Journal of Applied Physics. 1999 ; Vol. 85, No. 8 II A. pp. 4815-4817.
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