Abstract
Recent improvements in EM instrumentation have made convergent-beam electron diffraction a method of choice for studying lattice defects. The applications include grain and interphase boundaries, lattice defect symmetry characterization, and small precipitate crystallography. The method is described, illustrated, and discussed. -K.A.R.
Original language | English (US) |
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Pages (from-to) | 15-20 |
Number of pages | 6 |
Journal | Norelco Reporter |
Volume | 28 |
State | Published - Jan 1 1981 |
Externally published | Yes |
ASJC Scopus subject areas
- Environmental Science(all)
- Earth and Planetary Sciences(all)