Microdiffraction from crystals containing defects.

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Recent improvements in EM instrumentation have made convergent-beam electron diffraction a method of choice for studying lattice defects. The applications include grain and interphase boundaries, lattice defect symmetry characterization, and small precipitate crystallography. The method is described, illustrated, and discussed. -K.A.R.

Original languageEnglish (US)
Pages (from-to)15-20
Number of pages6
JournalNorelco Reporter
Volume28
StatePublished - 1981
Externally publishedYes

Fingerprint

defect
crystal
crystallography
diffraction
instrumentation
symmetry
electron
method

ASJC Scopus subject areas

  • Earth and Planetary Sciences(all)
  • Environmental Science(all)

Cite this

Microdiffraction from crystals containing defects. / Carpenter, Ray.

In: Norelco Reporter, Vol. 28, 1981, p. 15-20.

Research output: Contribution to journalArticle

@article{12eca6d6945b4b93a9526201d0a74fbe,
title = "Microdiffraction from crystals containing defects.",
abstract = "Recent improvements in EM instrumentation have made convergent-beam electron diffraction a method of choice for studying lattice defects. The applications include grain and interphase boundaries, lattice defect symmetry characterization, and small precipitate crystallography. The method is described, illustrated, and discussed. -K.A.R.",
author = "Ray Carpenter",
year = "1981",
language = "English (US)",
volume = "28",
pages = "15--20",
journal = "Norelco Reporter",
issn = "0029-1625",

}

TY - JOUR

T1 - Microdiffraction from crystals containing defects.

AU - Carpenter, Ray

PY - 1981

Y1 - 1981

N2 - Recent improvements in EM instrumentation have made convergent-beam electron diffraction a method of choice for studying lattice defects. The applications include grain and interphase boundaries, lattice defect symmetry characterization, and small precipitate crystallography. The method is described, illustrated, and discussed. -K.A.R.

AB - Recent improvements in EM instrumentation have made convergent-beam electron diffraction a method of choice for studying lattice defects. The applications include grain and interphase boundaries, lattice defect symmetry characterization, and small precipitate crystallography. The method is described, illustrated, and discussed. -K.A.R.

UR - http://www.scopus.com/inward/record.url?scp=0019656234&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0019656234&partnerID=8YFLogxK

M3 - Article

VL - 28

SP - 15

EP - 20

JO - Norelco Reporter

JF - Norelco Reporter

SN - 0029-1625

ER -