Abstract
Recent improvements in EM instrumentation have made convergent-beam electron diffraction a method of choice for studying lattice defects. The applications include grain and interphase boundaries, lattice defect symmetry characterization, and small precipitate crystallography. The method is described, illustrated, and discussed. -K.A.R.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 15-20 |
| Number of pages | 6 |
| Journal | Norelco Reporter |
| Volume | 28 |
| State | Published - 1981 |
| Externally published | Yes |
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ASJC Scopus subject areas
- Earth and Planetary Sciences(all)
- Environmental Science(all)
Cite this
Microdiffraction from crystals containing defects. / Carpenter, Ray.
In: Norelco Reporter, Vol. 28, 1981, p. 15-20.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Microdiffraction from crystals containing defects.
AU - Carpenter, Ray
PY - 1981
Y1 - 1981
N2 - Recent improvements in EM instrumentation have made convergent-beam electron diffraction a method of choice for studying lattice defects. The applications include grain and interphase boundaries, lattice defect symmetry characterization, and small precipitate crystallography. The method is described, illustrated, and discussed. -K.A.R.
AB - Recent improvements in EM instrumentation have made convergent-beam electron diffraction a method of choice for studying lattice defects. The applications include grain and interphase boundaries, lattice defect symmetry characterization, and small precipitate crystallography. The method is described, illustrated, and discussed. -K.A.R.
UR - http://www.scopus.com/inward/record.url?scp=0019656234&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0019656234&partnerID=8YFLogxK
M3 - Article
AN - SCOPUS:0019656234
VL - 28
SP - 15
EP - 20
JO - Norelco Reporter
JF - Norelco Reporter
SN - 0029-1625
ER -