Recent improvements in EM instrumentation have made convergent-beam electron diffraction a method of choice for studying lattice defects. The applications include grain and interphase boundaries, lattice defect symmetry characterization, and small precipitate crystallography. The method is described, illustrated, and discussed. -K.A.R.
|Original language||English (US)|
|Number of pages||6|
|State||Published - Jan 1 1981|
ASJC Scopus subject areas
- Environmental Science(all)
- Earth and Planetary Sciences(all)