Microdiffraction from crystals containing defects.

Research output: Contribution to journalArticle

1 Scopus citations

Abstract

Recent improvements in EM instrumentation have made convergent-beam electron diffraction a method of choice for studying lattice defects. The applications include grain and interphase boundaries, lattice defect symmetry characterization, and small precipitate crystallography. The method is described, illustrated, and discussed. -K.A.R.

Original languageEnglish (US)
Pages (from-to)15-20
Number of pages6
JournalNorelco Reporter
Volume28
StatePublished - Jan 1 1981

ASJC Scopus subject areas

  • Environmental Science(all)
  • Earth and Planetary Sciences(all)

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