Abstract
Recent improvements in EM instrumentation have made convergent-beam electron diffraction a method of choice for studying lattice defects. The applications include grain and interphase boundaries, lattice defect symmetry characterization, and small precipitate crystallography. The method is described, illustrated, and discussed. -K.A.R.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 15-20 |
| Number of pages | 6 |
| Journal | Norelco Reporter |
| Volume | 28 |
| State | Published - Jan 1 1981 |
ASJC Scopus subject areas
- Environmental Science(all)
- Earth and Planetary Sciences(all)