METRICS GUIDED METHODOLOGY.

C. V. Ramamoorthy, Wei Tek Tsai, Tsuneo Yamaura, Anupam Bhide

Research output: Chapter in Book/Report/Conference proceedingConference contribution

17 Citations (Scopus)

Abstract

The authors describe a software development process that they call a metrics-guided methodology. Metrics are used throughout the software life cycle. They are used to indicate the complexity of the software at each phase, to help in deciding if the present phase has been satisfactorily completed, to help make decisions about manpower allocation and deadlines, to suggest ways to reduce the complexity at that level, and to help in choosing between alternative decisions in proceeding to the next stage. The authors propose requirement-level metrics for the specification language RSL and discuss techniques to use metrics at the requirement phase for the traditional waterfall development model. They believe that the techniques could be modified for use in other development approaches. They have applied the techniques to a moderately complex example.

Original languageEnglish (US)
Title of host publicationProceedings - IEEE Computer Society's International Computer Software & Applications Conference
Place of PublicationNew York, NY, USA
PublisherIEEE
Pages111-120
Number of pages10
ISBN (Print)0818606436
StatePublished - 1985
Externally publishedYes

Fingerprint

Specification languages
Life cycle
Software engineering

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Ramamoorthy, C. V., Tsai, W. T., Yamaura, T., & Bhide, A. (1985). METRICS GUIDED METHODOLOGY. In Proceedings - IEEE Computer Society's International Computer Software & Applications Conference (pp. 111-120). New York, NY, USA: IEEE.

METRICS GUIDED METHODOLOGY. / Ramamoorthy, C. V.; Tsai, Wei Tek; Yamaura, Tsuneo; Bhide, Anupam.

Proceedings - IEEE Computer Society's International Computer Software & Applications Conference. New York, NY, USA : IEEE, 1985. p. 111-120.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ramamoorthy, CV, Tsai, WT, Yamaura, T & Bhide, A 1985, METRICS GUIDED METHODOLOGY. in Proceedings - IEEE Computer Society's International Computer Software & Applications Conference. IEEE, New York, NY, USA, pp. 111-120.
Ramamoorthy CV, Tsai WT, Yamaura T, Bhide A. METRICS GUIDED METHODOLOGY. In Proceedings - IEEE Computer Society's International Computer Software & Applications Conference. New York, NY, USA: IEEE. 1985. p. 111-120
Ramamoorthy, C. V. ; Tsai, Wei Tek ; Yamaura, Tsuneo ; Bhide, Anupam. / METRICS GUIDED METHODOLOGY. Proceedings - IEEE Computer Society's International Computer Software & Applications Conference. New York, NY, USA : IEEE, 1985. pp. 111-120
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