Metric forensics: A multi-level approach for mining volatile graphs

Keith Henderson, Tina Eliassi-Rad, Christos Faloutsos, Leman Akoglu, Lei Li, Koji Maruhashi, B. Aditya Prakash, Hanghang Tong

Research output: Chapter in Book/Report/Conference proceedingConference contribution

41 Scopus citations

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Engineering & Materials Science