Methodology for a sub-millimeter near-field beam pattern measurement system

Kristina K. Davis, Christopher Groppi, Hamdi Mani, Caleb Wheeler, Chris Walker

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Here we present the methodology and initial results for a new near-field antenna radiation measurement system for submillimeter receivers. The system is based on a 4-port vector network analyzer with two synthesized sources. This method improves on similar systems employing this technique with the use of the network analyzer, which reduces the cost and complexity of the system. Furthermore, a single set of test equipment can analyze multiple receivers with different central frequencies; the frequency range of the system is limited by the output range of the network analyzer and/or the power output of the source signal. The amplitude and phase stability of the system in one configuration at 350 GHz was measured and found to be accurate enough to permit near field antenna measurements. The proper characterization of phase drifts across multiple test configurations demonstrates system reliability. These initial results will determine parameters necessary for implementing a near-field radiation pattern measurement of a Schottky diode receiver operating between 340-360 GHz.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
Volume9153
ISBN (Print)9780819496218
DOIs
StatePublished - 2014
EventMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VII - Montreal, Canada
Duration: Jun 24 2014Jun 27 2014

Other

OtherMillimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VII
CountryCanada
CityMontreal
Period6/24/146/27/14

Fingerprint

Electric network analyzers
Near-field
Measurement System
analyzers
near fields
receivers
methodology
Methodology
antennas
Receiver
Antenna radiation
radiation measurement
Phase stability
output
Antenna
configurations
Schottky diodes
test equipment
Radiation
Diodes

Keywords

  • antenna beam pattern
  • beam pattern measurements
  • Near field measurements
  • sub-millimeter receiver characterization

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Davis, K. K., Groppi, C., Mani, H., Wheeler, C., & Walker, C. (2014). Methodology for a sub-millimeter near-field beam pattern measurement system. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 9153). [91533F] SPIE. https://doi.org/10.1117/12.2056844

Methodology for a sub-millimeter near-field beam pattern measurement system. / Davis, Kristina K.; Groppi, Christopher; Mani, Hamdi; Wheeler, Caleb; Walker, Chris.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9153 SPIE, 2014. 91533F.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Davis, KK, Groppi, C, Mani, H, Wheeler, C & Walker, C 2014, Methodology for a sub-millimeter near-field beam pattern measurement system. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 9153, 91533F, SPIE, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VII, Montreal, Canada, 6/24/14. https://doi.org/10.1117/12.2056844
Davis KK, Groppi C, Mani H, Wheeler C, Walker C. Methodology for a sub-millimeter near-field beam pattern measurement system. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9153. SPIE. 2014. 91533F https://doi.org/10.1117/12.2056844
Davis, Kristina K. ; Groppi, Christopher ; Mani, Hamdi ; Wheeler, Caleb ; Walker, Chris. / Methodology for a sub-millimeter near-field beam pattern measurement system. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 9153 SPIE, 2014.
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