Mercury cadmium telluride/tellurium intergrowths in HgCdTe epilayers grown by molecular-beam epitaxy

T. Aoki, David Smith, Y. Chang, J. Zhao, G. Badano, C. Grein, S. Sivananthan

Research output: Contribution to journalArticlepeer-review

25 Scopus citations

Abstract

The surface crater defects in HgCdTe epilayers grown by molecular-beam epitaxy were discussed. It was found that these defects originated primarily within the HgCdTe films and were shown to be associated with the local development of polycrystalline morphology. The occurrence of finely spaced HgCdTe/Te intergrowths with either semicoherent or incoherent grain boundaries was also established.

Original languageEnglish (US)
Pages (from-to)2275-2277
Number of pages3
JournalApplied Physics Letters
Volume82
Issue number14
DOIs
StatePublished - Apr 7 2003

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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