Abstract
During a fluctuation electron microscopy (FEM) study of disordered carbons, we found that samples containing C60 exhibit a normalized variance peak at 7.1 nm-1 that appears to be a unique indicator of tight curvature in layered materials. This peak is associated with the characteristic in-plane carbon-carbon bond distance of ∼0.14 nm in graphene. Diffraction from this spacing is normally forbidden in planar graphene (and graphite), but becomes allowed when the layer structure is interrupted. Such interruptions arise at the edges of graphite fragments and also when 5-rings are incorporated into a layer. We show that the curvature induced by a high density of 5-rings, such as that in C60, can dominate the variance peak at 7.1 nm-1. FEM simulations reveal that the variance peak at ∼7.1 nm-1, which we label F1, is one of several fullerene-signature peaks, with others occurring at Q values of 10.6 nm-1 (F2) and 12.4 nm-1 (F3). We conclude that FEM is a sensitive method for detecting dilute quantities of highly curved pentagon-rich fullerenes, such as C60, when dispersed within disordered graphitic carbon.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 177-188 |
| Number of pages | 12 |
| Journal | Ultramicroscopy |
| Volume | 109 |
| Issue number | 2 |
| DOIs | |
| State | Published - Jan 2009 |
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Keywords
- C60
- Fluctuation microscopy
- Fullerenes
- Medium-range order
- Shungite
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- Instrumentation
- Electronic, Optical and Magnetic Materials
Cite this
Medium-range order in molecular materials : Fluctuation electron microscopy for detecting fullerenes in disordered carbons. / Zhao, G.; Buseck, P R; Rougée, A.; Treacy, Michael.
In: Ultramicroscopy, Vol. 109, No. 2, 01.2009, p. 177-188.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Medium-range order in molecular materials
T2 - Fluctuation electron microscopy for detecting fullerenes in disordered carbons
AU - Zhao, G.
AU - Buseck, P R
AU - Rougée, A.
AU - Treacy, Michael
PY - 2009/1
Y1 - 2009/1
N2 - During a fluctuation electron microscopy (FEM) study of disordered carbons, we found that samples containing C60 exhibit a normalized variance peak at 7.1 nm-1 that appears to be a unique indicator of tight curvature in layered materials. This peak is associated with the characteristic in-plane carbon-carbon bond distance of ∼0.14 nm in graphene. Diffraction from this spacing is normally forbidden in planar graphene (and graphite), but becomes allowed when the layer structure is interrupted. Such interruptions arise at the edges of graphite fragments and also when 5-rings are incorporated into a layer. We show that the curvature induced by a high density of 5-rings, such as that in C60, can dominate the variance peak at 7.1 nm-1. FEM simulations reveal that the variance peak at ∼7.1 nm-1, which we label F1, is one of several fullerene-signature peaks, with others occurring at Q values of 10.6 nm-1 (F2) and 12.4 nm-1 (F3). We conclude that FEM is a sensitive method for detecting dilute quantities of highly curved pentagon-rich fullerenes, such as C60, when dispersed within disordered graphitic carbon.
AB - During a fluctuation electron microscopy (FEM) study of disordered carbons, we found that samples containing C60 exhibit a normalized variance peak at 7.1 nm-1 that appears to be a unique indicator of tight curvature in layered materials. This peak is associated with the characteristic in-plane carbon-carbon bond distance of ∼0.14 nm in graphene. Diffraction from this spacing is normally forbidden in planar graphene (and graphite), but becomes allowed when the layer structure is interrupted. Such interruptions arise at the edges of graphite fragments and also when 5-rings are incorporated into a layer. We show that the curvature induced by a high density of 5-rings, such as that in C60, can dominate the variance peak at 7.1 nm-1. FEM simulations reveal that the variance peak at ∼7.1 nm-1, which we label F1, is one of several fullerene-signature peaks, with others occurring at Q values of 10.6 nm-1 (F2) and 12.4 nm-1 (F3). We conclude that FEM is a sensitive method for detecting dilute quantities of highly curved pentagon-rich fullerenes, such as C60, when dispersed within disordered graphitic carbon.
KW - C60
KW - Fluctuation microscopy
KW - Fullerenes
KW - Medium-range order
KW - Shungite
UR - http://www.scopus.com/inward/record.url?scp=57749187633&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=57749187633&partnerID=8YFLogxK
U2 - 10.1016/j.ultramic.2008.10.006
DO - 10.1016/j.ultramic.2008.10.006
M3 - Article
C2 - 19062186
AN - SCOPUS:57749187633
VL - 109
SP - 177
EP - 188
JO - Ultramicroscopy
JF - Ultramicroscopy
SN - 0304-3991
IS - 2
ER -