Medium-range order in molecular materials: Fluctuation electron microscopy for detecting fullerenes in disordered carbons

G. Zhao, P R Buseck, A. Rougée, Michael Treacy

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

During a fluctuation electron microscopy (FEM) study of disordered carbons, we found that samples containing C60 exhibit a normalized variance peak at 7.1 nm-1 that appears to be a unique indicator of tight curvature in layered materials. This peak is associated with the characteristic in-plane carbon-carbon bond distance of ∼0.14 nm in graphene. Diffraction from this spacing is normally forbidden in planar graphene (and graphite), but becomes allowed when the layer structure is interrupted. Such interruptions arise at the edges of graphite fragments and also when 5-rings are incorporated into a layer. We show that the curvature induced by a high density of 5-rings, such as that in C60, can dominate the variance peak at 7.1 nm-1. FEM simulations reveal that the variance peak at ∼7.1 nm-1, which we label F1, is one of several fullerene-signature peaks, with others occurring at Q values of 10.6 nm-1 (F2) and 12.4 nm-1 (F3). We conclude that FEM is a sensitive method for detecting dilute quantities of highly curved pentagon-rich fullerenes, such as C60, when dispersed within disordered graphitic carbon.

Original languageEnglish (US)
Pages (from-to)177-188
Number of pages12
JournalUltramicroscopy
Volume109
Issue number2
DOIs
StatePublished - Jan 2009

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Fullerenes
Graphite
Electron microscopy
fullerenes
electron microscopy
Carbon
carbon
Graphene
graphene
graphite
curvature
rings
interruption
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Diffraction
spacing
signatures
fragments
diffraction
simulation

Keywords

  • C60
  • Fluctuation microscopy
  • Fullerenes
  • Medium-range order
  • Shungite

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Electronic, Optical and Magnetic Materials

Cite this

Medium-range order in molecular materials : Fluctuation electron microscopy for detecting fullerenes in disordered carbons. / Zhao, G.; Buseck, P R; Rougée, A.; Treacy, Michael.

In: Ultramicroscopy, Vol. 109, No. 2, 01.2009, p. 177-188.

Research output: Contribution to journalArticle

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