Mechanisms of enhanced radiation-induced degradation due to excess molecular hydrogen in bipolar oxides

X. J. Chen, Hugh Barnaby, B. Vermeire, Keith Holbert, D. Wright, R. L. Pease, G. Dunham, D. G. Platteter, J. Seiler, S. McClure, P. Adell

Research output: Contribution to journalArticle

59 Citations (Scopus)

Abstract

Bipolar junction test structures packaged in hermetically sealed packages with excess molecular hydrogen (H 2) showed enhanced degradation after radiation exposure. Using chemical kinetics, we propose a model that quantitatively establishes the relationship between excess H 2 and radiation-induced interface trap formation. Using environments with different molecular hydrogen concentrations, radiation experiments were performed and the experimental data showed excellent agreement with the proposed model. The results, both experimentally and theoretically, showed increased radiation induced degradation with H 2 concentration, and device degradation saturate at both high and low ends of H 2 cocentrations.

Original languageEnglish (US)
Pages (from-to)1913-1919
Number of pages7
JournalIEEE Transactions on Nuclear Science
Volume54
Issue number6
DOIs
StatePublished - Dec 2007

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degradation
Radiation
Degradation
Hydrogen
Oxides
oxides
hydrogen
radiation
radiation dosage
reaction kinetics
Reaction kinetics
traps
Experiments

Keywords

  • Bipolar oxide
  • Gated bipolar devices
  • Hydrogen
  • Interface traps
  • Radiation-induced

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Nuclear Energy and Engineering

Cite this

Mechanisms of enhanced radiation-induced degradation due to excess molecular hydrogen in bipolar oxides. / Chen, X. J.; Barnaby, Hugh; Vermeire, B.; Holbert, Keith; Wright, D.; Pease, R. L.; Dunham, G.; Platteter, D. G.; Seiler, J.; McClure, S.; Adell, P.

In: IEEE Transactions on Nuclear Science, Vol. 54, No. 6, 12.2007, p. 1913-1919.

Research output: Contribution to journalArticle

Chen, XJ, Barnaby, H, Vermeire, B, Holbert, K, Wright, D, Pease, RL, Dunham, G, Platteter, DG, Seiler, J, McClure, S & Adell, P 2007, 'Mechanisms of enhanced radiation-induced degradation due to excess molecular hydrogen in bipolar oxides', IEEE Transactions on Nuclear Science, vol. 54, no. 6, pp. 1913-1919. https://doi.org/10.1109/TNS.2007.909708
Chen, X. J. ; Barnaby, Hugh ; Vermeire, B. ; Holbert, Keith ; Wright, D. ; Pease, R. L. ; Dunham, G. ; Platteter, D. G. ; Seiler, J. ; McClure, S. ; Adell, P. / Mechanisms of enhanced radiation-induced degradation due to excess molecular hydrogen in bipolar oxides. In: IEEE Transactions on Nuclear Science. 2007 ; Vol. 54, No. 6. pp. 1913-1919.
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