Abstract
Quantization of ion microprobe mass spectrometric analyses has been complicated by the variation in the ion yield of an element contained in different matrices. This work demonstrates that, for O- and Cs + bombardment, these ion-yield variations are solely attributable to variations in the matrix sputtering yield. It is argued that the matrix sputtering yield determines the near-surface concentration of the ion-yield-enhancing species O and Cs.
Original language | English (US) |
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Pages (from-to) | 832-835 |
Number of pages | 4 |
Journal | Applied Physics Letters |
Volume | 33 |
Issue number | 9 |
DOIs | |
State | Published - 1978 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)