Mechanical detachment of nanometer particles strongly adhering to a substrate: An application of corrosive tribology

J. T. Dickinson, Rizal Hariadi, S. C. Langford

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The tip of a scanning probe microscope was used to detach nanometer-scale, single crystal NaCl particles grown on soda lime glass substrates. After imaging a particle at low contact forces, a single line scan at high contact force was used to detach the particle from the substrate. The peak lateral force at detachment is a strong function of particle contact area and humidity. As the relative humidity is raised from low to high values, the strength of the particle-substrate bond decreases dramatically. We interpret these results in terms of detachment by chemically-assisted crack growth along the NaCl-glass interface. Numerical estimates of the electrostatic and dispersive contributions to the work of adhesion are also discussed.

Original languageEnglish (US)
Pages (from-to)373-390
Number of pages18
JournalJournal of Adhesion
Volume74
Issue number1-4
StatePublished - 2000
Externally publishedYes

Fingerprint

Caustics
tribology
Tribology
detachment
Atmospheric humidity
Substrates
Glass
humidity
Lime
Electrostatics
Crack propagation
Microscopes
Adhesion
Single crystals
glass
Scanning
Imaging techniques
calcium oxides
adhesion
cracks

Keywords

  • Crack growth, chemically assisted
  • Humidity effects
  • Particle removal
  • Scanning force microscopy
  • Work of adhesion Model

ASJC Scopus subject areas

  • Chemical Engineering(all)
  • Materials Science(all)
  • Mechanics of Materials
  • Computational Mechanics

Cite this

Mechanical detachment of nanometer particles strongly adhering to a substrate : An application of corrosive tribology. / Dickinson, J. T.; Hariadi, Rizal; Langford, S. C.

In: Journal of Adhesion, Vol. 74, No. 1-4, 2000, p. 373-390.

Research output: Contribution to journalArticle

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