Mechanical detachment of nanometer particles strongly adhering to a substrate: An application of corrosive tribology

J. T. Dickinson, R. F. Hariadi, S. C. Langford

Research output: Contribution to journalArticle

2 Scopus citations


The tip of a scanning probe microscope was used to detach nanometer-scale, single crystal NaCl particles grown on soda lime glass substrates. After imaging a particle at low contact forces, a single line scan at high contact force was used to detach the particle from the substrate. The peak lateral force at detachment is a strong function of particle contact area and humidity. As the relative humidity is raised from low to high values, the strength of the particle-substrate bond decreases dramatically. We interpret these results in terms of detachment by chemically-assisted crack growth along the NaCl-glass interface. Numerical estimates of the electrostatic and dispersive contributions to the work of adhesion are also discussed.

Original languageEnglish (US)
Pages (from-to)373-390
Number of pages18
JournalJournal of Adhesion
Issue number1-4
StatePublished - Jan 1 2000



  • Crack growth, chemically assisted
  • Humidity effects
  • Particle removal
  • Scanning force microscopy
  • Work of adhesion Model

ASJC Scopus subject areas

  • Chemistry(all)
  • Mechanics of Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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