Measurements of Debye-Waller factors in TiAl from energy-filtered HOLZ line intensities

R. Holmestad, A. L. Weickenmeier, J. M. Zuo, John Spence, Z. Horita

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

A new method to measure Debye Waller factors is reported in this article. The specimen analyzed is TiAl which was thinned by twin jet electropolishing. The measurement of the factors is necessary for the structure factor refinement in TiAl. It is aimed to get CBED pattern near a sparse zone axis, to extract line scans along HOLZ lines from the pattern. Two beam intensity is calculated to fit experiment and simulation by Debye Waller factor variations.

Original languageEnglish (US)
Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
PublisherPubl by San Francisco Press Inc
Pages698-699
Number of pages2
StatePublished - 1993
EventProceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA
Duration: Aug 1 1993Aug 6 1993

Other

OtherProceedings of the 51st Annual Meeting Microscopy Society of America
CityCincinnati, OH, USA
Period8/1/938/6/93

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Electrolytic polishing
Experiments

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Holmestad, R., Weickenmeier, A. L., Zuo, J. M., Spence, J., & Horita, Z. (1993). Measurements of Debye-Waller factors in TiAl from energy-filtered HOLZ line intensities. In Proceedings - Annual Meeting, Microscopy Society of America (pp. 698-699). Publ by San Francisco Press Inc.

Measurements of Debye-Waller factors in TiAl from energy-filtered HOLZ line intensities. / Holmestad, R.; Weickenmeier, A. L.; Zuo, J. M.; Spence, John; Horita, Z.

Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, 1993. p. 698-699.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Holmestad, R, Weickenmeier, AL, Zuo, JM, Spence, J & Horita, Z 1993, Measurements of Debye-Waller factors in TiAl from energy-filtered HOLZ line intensities. in Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, pp. 698-699, Proceedings of the 51st Annual Meeting Microscopy Society of America, Cincinnati, OH, USA, 8/1/93.
Holmestad R, Weickenmeier AL, Zuo JM, Spence J, Horita Z. Measurements of Debye-Waller factors in TiAl from energy-filtered HOLZ line intensities. In Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc. 1993. p. 698-699
Holmestad, R. ; Weickenmeier, A. L. ; Zuo, J. M. ; Spence, John ; Horita, Z. / Measurements of Debye-Waller factors in TiAl from energy-filtered HOLZ line intensities. Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, 1993. pp. 698-699
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