Measurement of the coherence length of sputtered Nb0.62Ti0.38N thin films

Lei Yu; Nathan Newman; John M. Rowell

doi:10.1109/TASC.2002.1020339

Measurement of the coherence length of sputtered Nb_0.62Ti_0.38N thin films

Lei Yu, Nathan Newman, John M. Rowell

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

Superconducting and normal state properties of the useful film material Nb_xTi_1-xN have been characterized. In particular, the coherence length of reactively sputtered Nb_0.62Ti_0.38N thin films is determined to be 2.4 ± 0.3 nm. The results are inferred from fitting the de Gennes-Werthamer theory to experimental measurements of the proximity-induced depression of the transition temperature in Nb-Nb_0.62Ti_0.38N-Nb structures. The coherence length, as defined by this theory, can be used to infer the zero-temperature Ginzburg-Landau coherence length, ξ_GL (0), of 3.8 nm for the Nb_0.62Ti_0.38N synthesized in this study. The shorter coherence length and lower resistivity of these films, when compared to NbN, indicates that they are an appealing choice for electrodes in Rapid Single Flux Quantum (RFSQ) circuits.

Original language	English (US)
Pages (from-to)	1795-1798
Number of pages	4
Journal	IEEE Transactions on Applied Superconductivity
Volume	12
Issue number	2
DOIs	https://doi.org/10.1109/TASC.2002.1020339
State	Published - Jun 2002

Keywords

Coherence length
Low-temperature superconductors
NbN
NbTiN
Proximity effect
Thin film

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1109/TASC.2002.1020339

Cite this

@article{35d1decf5c874e89968c5896c9b9059f,

title = "Measurement of the coherence length of sputtered Nb0.62Ti0.38N thin films",

abstract = "Superconducting and normal state properties of the useful film material NbxTi1-xN have been characterized. In particular, the coherence length of reactively sputtered Nb0.62Ti0.38N thin films is determined to be 2.4 ± 0.3 nm. The results are inferred from fitting the de Gennes-Werthamer theory to experimental measurements of the proximity-induced depression of the transition temperature in Nb-Nb0.62Ti0.38N-Nb structures. The coherence length, as defined by this theory, can be used to infer the zero-temperature Ginzburg-Landau coherence length, ξGL (0), of 3.8 nm for the Nb0.62Ti0.38N synthesized in this study. The shorter coherence length and lower resistivity of these films, when compared to NbN, indicates that they are an appealing choice for electrodes in Rapid Single Flux Quantum (RFSQ) circuits.",

keywords = "Coherence length, Low-temperature superconductors, NbN, NbTiN, Proximity effect, Thin film",

author = "Lei Yu and Nathan Newman and Rowell, {John M.}",

note = "Funding Information: Manuscript received July 3, 2001; revised December 3, 2001. The review of this paper was supervised by J. Spargo. This work was supported by the Office of Naval Research under Contract N00014-01-1-0047. L. Yu is with the Department of Electrical Engineering, Arizona State University, Tempe, AZ 85260-6006 USA. N. Newman is with the Department of Chemical and Materials Engineering, Arizona State University, Tempe, AZ 85287-6006 USA. J. M. Rowell is with the Materials Research Institute, Northwestern University, Evanston, IL 60208 USA and the Department of Chemical and Materials Engineering, Arizona State University, Tempe, AZ 85287-6006 USA. Publisher Item Identifier S 1051-8223(02)05429-5.",

year = "2002",

month = jun,

doi = "10.1109/TASC.2002.1020339",

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journal = "IEEE Transactions on Applied Superconductivity",

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T1 - Measurement of the coherence length of sputtered Nb0.62Ti0.38N thin films

AU - Yu, Lei

AU - Newman, Nathan

AU - Rowell, John M.

N1 - Funding Information: Manuscript received July 3, 2001; revised December 3, 2001. The review of this paper was supervised by J. Spargo. This work was supported by the Office of Naval Research under Contract N00014-01-1-0047. L. Yu is with the Department of Electrical Engineering, Arizona State University, Tempe, AZ 85260-6006 USA. N. Newman is with the Department of Chemical and Materials Engineering, Arizona State University, Tempe, AZ 85287-6006 USA. J. M. Rowell is with the Materials Research Institute, Northwestern University, Evanston, IL 60208 USA and the Department of Chemical and Materials Engineering, Arizona State University, Tempe, AZ 85287-6006 USA. Publisher Item Identifier S 1051-8223(02)05429-5.

PY - 2002/6

Y1 - 2002/6

N2 - Superconducting and normal state properties of the useful film material NbxTi1-xN have been characterized. In particular, the coherence length of reactively sputtered Nb0.62Ti0.38N thin films is determined to be 2.4 ± 0.3 nm. The results are inferred from fitting the de Gennes-Werthamer theory to experimental measurements of the proximity-induced depression of the transition temperature in Nb-Nb0.62Ti0.38N-Nb structures. The coherence length, as defined by this theory, can be used to infer the zero-temperature Ginzburg-Landau coherence length, ξGL (0), of 3.8 nm for the Nb0.62Ti0.38N synthesized in this study. The shorter coherence length and lower resistivity of these films, when compared to NbN, indicates that they are an appealing choice for electrodes in Rapid Single Flux Quantum (RFSQ) circuits.

AB - Superconducting and normal state properties of the useful film material NbxTi1-xN have been characterized. In particular, the coherence length of reactively sputtered Nb0.62Ti0.38N thin films is determined to be 2.4 ± 0.3 nm. The results are inferred from fitting the de Gennes-Werthamer theory to experimental measurements of the proximity-induced depression of the transition temperature in Nb-Nb0.62Ti0.38N-Nb structures. The coherence length, as defined by this theory, can be used to infer the zero-temperature Ginzburg-Landau coherence length, ξGL (0), of 3.8 nm for the Nb0.62Ti0.38N synthesized in this study. The shorter coherence length and lower resistivity of these films, when compared to NbN, indicates that they are an appealing choice for electrodes in Rapid Single Flux Quantum (RFSQ) circuits.

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