Measurement of the coherence length of sputtered Nb0.62Ti0.38N thin films

Lei Yu, Nathan Newman, John M. Rowell

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Superconducting and normal state properties of the useful film material NbxTi1-xN have been characterized. In particular, the coherence length of reactively sputtered Nb0.62Ti0.38N thin films is determined to be 2.4 ± 0.3 nm. The results are inferred from fitting the de Gennes-Werthamer theory to experimental measurements of the proximity-induced depression of the transition temperature in Nb-Nb0.62Ti0.38N-Nb structures. The coherence length, as defined by this theory, can be used to infer the zero-temperature Ginzburg-Landau coherence length, ξGL (0), of 3.8 nm for the Nb0.62Ti0.38N synthesized in this study. The shorter coherence length and lower resistivity of these films, when compared to NbN, indicates that they are an appealing choice for electrodes in Rapid Single Flux Quantum (RFSQ) circuits.

Original languageEnglish (US)
Pages (from-to)1795-1798
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume12
Issue number2
DOIs
StatePublished - Jun 2002

Fingerprint

Thin films
thin films
Superconducting transition temperature
proximity
transition temperature
Fluxes
Electrodes
electrical resistivity
electrodes
Networks (circuits)
Temperature
temperature

Keywords

  • Coherence length
  • Low-temperature superconductors
  • NbTiN
  • NbN
  • Proximity effect
  • Thin film

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Physics and Astronomy (miscellaneous)

Cite this

Measurement of the coherence length of sputtered Nb0.62Ti0.38N thin films. / Yu, Lei; Newman, Nathan; Rowell, John M.

In: IEEE Transactions on Applied Superconductivity, Vol. 12, No. 2, 06.2002, p. 1795-1798.

Research output: Contribution to journalArticle

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