@article{668aa93779a14d8ebfa7bd9e0bc42230,
title = "Measurement of individual structure‐factor phases with tenth‐degree accuracy: the 00.2 reflection in BeO studied by electron and X‐ray diffraction",
author = "Zuo, {J. M.} and John Spence and J. Downs and J. Mayer",
year = "1993",
month = may,
doi = "10.1107/S0108767392010699",
language = "English (US)",
volume = "49",
pages = "422--429",
journal = "Acta Crystallographica Section A: Foundations and Advances",
issn = "0108-7673",
publisher = "John Wiley and Sons Inc.",
number = "3",
}