Measurement of individual structure‐factor phases with tenth‐degree accuracy

the 00.2 reflection in BeO studied by electron and X‐ray diffraction

J. M. Zuo, John Spence, J. Downs, J. Mayer

Research output: Contribution to journalArticle

18 Citations (Scopus)
Original languageEnglish (US)
Pages (from-to)422-429
Number of pages8
JournalActa Crystallographica Section A: Foundations of Crystallography
Volume49
Issue number3
DOIs
StatePublished - 1993

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X-Ray Diffraction
Electrons

ASJC Scopus subject areas

  • Structural Biology

Cite this

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title = "Measurement of individual structure‐factor phases with tenth‐degree accuracy: the 00.2 reflection in BeO studied by electron and X‐ray diffraction",
author = "Zuo, {J. M.} and John Spence and J. Downs and J. Mayer",
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AU - Mayer, J.

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JO - Acta Crystallographica Section A: Foundations and Advances

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