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Measurement of InAsBi mole fraction and InBi lattice constant using Rutherford backscattering spectrometry and X-ray diffraction
A. J. Shalindar, P. T. Webster, B. J. Wilkens, Terry Alford, Shane Johnson
- Engineering of Matter, Transport and Energy, School for (IAFSE-SEMTE)
- Materials Science and Engineering
- Mechanical and Aerospace Engineering
- Chemical Engineering
- Connection One (C1)
- Knowledge Enterprise (KE)
- Photonics Innovation, Center for (CPhI)
- Electrical Engineering
- Solid State Electronics Research Center (CSSER)
- Nano-Electronics, Arizona Institute of (AINE)
- Engineering, Ira A. Fulton Schools of (IAFSE)
- Electrical, Computer, and Energy Engineering, School of (IAFSE-ECEE)
- REACH Institute
Research output: Contribution to journal › Article › peer-review
23
Scopus
citations