Measurement of field emission from nitrogen-doped diamond films

A. T. Sowers, B. L. Ward, S. L. English, Robert Nemanich

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

This study explores issues related to the measurement of the field emission properties of nitrogen-doped diamond grown by microwave plasma chemical vapor deposition (CVD). Growth conditions have been optimized to produce films with a low concentration of sp2-bonded carbon which results in high electrical resistance. Field emission characteristics were measured in an ultrahigh vacuum with a variable distance anode technique. For samples grown with gas phase [N]/[C] ratios less than 10, damage from micro-arcs occurred during the field emission measurements. Samples grown at higher [N]/[C] content could be measured prior to an arcing event. The occurrence of a micro-arc is related to the film properties. The measurements indicate relatively high threshold fields (> 100 V μm-1) for electron emission.

Original languageEnglish (US)
Pages (from-to)1569-1573
Number of pages5
JournalDiamond and Related Materials
Volume9
Issue number9
DOIs
StatePublished - Sep 2000
Externally publishedYes

Fingerprint

Diamond films
diamond films
Field emission
field emission
Nitrogen
nitrogen
arcs
Diamond
Acoustic impedance
Electron emission
Ultrahigh vacuum
electrical resistance
electron emission
ultrahigh vacuum
low concentrations
Chemical vapor deposition
Diamonds
Anodes
anodes
Carbon

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Surfaces, Coatings and Films
  • Surfaces and Interfaces

Cite this

Measurement of field emission from nitrogen-doped diamond films. / Sowers, A. T.; Ward, B. L.; English, S. L.; Nemanich, Robert.

In: Diamond and Related Materials, Vol. 9, No. 9, 09.2000, p. 1569-1573.

Research output: Contribution to journalArticle

Sowers, A. T. ; Ward, B. L. ; English, S. L. ; Nemanich, Robert. / Measurement of field emission from nitrogen-doped diamond films. In: Diamond and Related Materials. 2000 ; Vol. 9, No. 9. pp. 1569-1573.
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