Measurement of energy deposition in transmission electron microscopy

Peter Rez; R. W. Glaisher

doi:10.1016/0304-3991(91)90046-9

Measurement of energy deposition in transmission electron microscopy

Peter Rez, R. W. Glaisher

Research output: Contribution to journal › Article › peer-review

26 Scopus citations

Abstract

Various anomalous observations, such as atomic clouds and particles spinning under electron beam irradiation, have been reported. In this note we show that it is possible to estimate the energy deposited by the electron beam from the energy-loss spectrum. This not only constrains proposed mechanisms to explain these observations but should also help elucidate the mechanism for other radiation damage processes.

Original language	English (US)
Pages (from-to)	65-69
Number of pages	5
Journal	Ultramicroscopy
Volume	35
Issue number	1
DOIs	https://doi.org/10.1016/0304-3991(91)90046-9
State	Published - Jan 1991

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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title = "Measurement of energy deposition in transmission electron microscopy",

abstract = "Various anomalous observations, such as atomic clouds and particles spinning under electron beam irradiation, have been reported. In this note we show that it is possible to estimate the energy deposited by the electron beam from the energy-loss spectrum. This not only constrains proposed mechanisms to explain these observations but should also help elucidate the mechanism for other radiation damage processes.",

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AB - Various anomalous observations, such as atomic clouds and particles spinning under electron beam irradiation, have been reported. In this note we show that it is possible to estimate the energy deposited by the electron beam from the energy-loss spectrum. This not only constrains proposed mechanisms to explain these observations but should also help elucidate the mechanism for other radiation damage processes.

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Measurement of energy deposition in transmission electron microscopy

Abstract

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