Measurement of electron transport properties of molecular junctions fabricated by electrochemical and mechanical methods

X. L. Li, H. X. He, B. Q. Xu, X. Y. Xiao, L. A. Nagahara, I. Amlani, R. Tsui, Nongjian Tao

Research output: Contribution to journalArticle

18 Citations (Scopus)

Abstract

We describe two methods to fabricate metal-molecule-metal junctions. The first method starts with a pair of electrodes separated with a molecular scale gap on an oxidized silicon substrate. These electrodes are fabricated by combining electron beam lithography and electrochemical deposition/etching. A molecular junction is formed when a molecule bridges the gap. This method can fabricate rather stable molecular junctions, however, the yield is low and the exact number of molecules in the junctions is uncertain. The second method forms a molecular junction by separating a scanning tunneling microscope tip from contact with a metal substrate in a solution containing sample molecules. This method, although is not device compatible, can create a large number of molecular junctions over a short period of time, which is ideal for statistical analysis.

Original languageEnglish (US)
Pages (from-to)1-10
Number of pages10
JournalSurface Science
Volume573
Issue number1
DOIs
StatePublished - Dec 1 2004

Fingerprint

Electron transport properties
transport properties
Molecules
Metals
electrons
Electrodes
Electron beam lithography
molecules
Silicon
Substrates
metals
Contacts (fluid mechanics)
Etching
Statistical methods
Microscopes
electrodes
Scanning
statistical analysis
lithography
microscopes

Keywords

  • Electrical transport measurements
  • Electrochemical methods

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Measurement of electron transport properties of molecular junctions fabricated by electrochemical and mechanical methods. / Li, X. L.; He, H. X.; Xu, B. Q.; Xiao, X. Y.; Nagahara, L. A.; Amlani, I.; Tsui, R.; Tao, Nongjian.

In: Surface Science, Vol. 573, No. 1, 01.12.2004, p. 1-10.

Research output: Contribution to journalArticle

Li, X. L. ; He, H. X. ; Xu, B. Q. ; Xiao, X. Y. ; Nagahara, L. A. ; Amlani, I. ; Tsui, R. ; Tao, Nongjian. / Measurement of electron transport properties of molecular junctions fabricated by electrochemical and mechanical methods. In: Surface Science. 2004 ; Vol. 573, No. 1. pp. 1-10.
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