Measurement-based power profiling of data center equipment

Tridib Mukherjee; Georgios Varsamopoulos; Sandeep Gupta; Sanjay Rungta

doi:10.1109/CLUSTR.2007.4629270

Measurement-based power profiling of data center equipment

Tridib Mukherjee, Georgios Varsamopoulos, Sandeep Gupta, Sanjay Rungta

IAFSE-CIDSE: Computer Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

18 Scopus citations

Original language	English (US)
Title of host publication	Proceedings - 2007 IEEE International Conference on Cluster Computing, CLUSTER 2007
Pages	476-477
Number of pages	2
DOIs	https://doi.org/10.1109/CLUSTR.2007.4629270
State	Published - Dec 1 2007
Event	2007 IEEE International Conference on Cluster Computing, CLUSTER 2007 - Austin, TX, United States Duration: Sep 19 2007 → Sep 20 2007

Publication series

Name	Proceedings - IEEE International Conference on Cluster Computing, ICCC
ISSN (Print)	1552-5244

Other

Other	2007 IEEE International Conference on Cluster Computing, CLUSTER 2007
Country	United States
City	Austin, TX
Period	9/19/07 → 9/20/07

ASJC Scopus subject areas

Software
Hardware and Architecture
Signal Processing

Cite this

Mukherjee, T., Varsamopoulos, G., Gupta, S., & Rungta, S. (2007). Measurement-based power profiling of data center equipment. In Proceedings - 2007 IEEE International Conference on Cluster Computing, CLUSTER 2007 (pp. 476-477). [4629270] (Proceedings - IEEE International Conference on Cluster Computing, ICCC). https://doi.org/10.1109/CLUSTR.2007.4629270

Measurement-based power profiling of data center equipment. / Mukherjee, Tridib; Varsamopoulos, Georgios; Gupta, Sandeep; Rungta, Sanjay.

Proceedings - 2007 IEEE International Conference on Cluster Computing, CLUSTER 2007. 2007. p. 476-477 4629270 (Proceedings - IEEE International Conference on Cluster Computing, ICCC).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Mukherjee, T, Varsamopoulos, G, Gupta, S & Rungta, S 2007, Measurement-based power profiling of data center equipment. in Proceedings - 2007 IEEE International Conference on Cluster Computing, CLUSTER 2007., 4629270, Proceedings - IEEE International Conference on Cluster Computing, ICCC, pp. 476-477, 2007 IEEE International Conference on Cluster Computing, CLUSTER 2007, Austin, TX, United States, 9/19/07. https://doi.org/10.1109/CLUSTR.2007.4629270

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Access to Document

10.1109/CLUSTR.2007.4629270