TY - JOUR
T1 - Measurement and prediction of Young's modulus of a Pb-free solder
AU - Chawla, Nikhilesh
AU - Ochoa, F.
AU - Ganesh, V. V.
AU - Deng, X.
AU - Koopman, M.
AU - Chawla, K. K.
AU - Scarritt, S.
N1 - Funding Information:
This research was supported by the National Science Foundation, contract #DMR-0092530 (Program Managers: K. L. Murty and B. Macdonald). We are also grateful to Indium Corporation for providing the solder ingots used in this study.
PY - 2004/6
Y1 - 2004/6
N2 - Accurate and reproducible measurements of the Young's modulus of solders are complicated by the early onset of yielding, microporosity, and variations in cooling rate. In this study, we report measurements of Young's modulus of an Sn-3.5 wt % Ag solder by two techniques: (a) loading-unloading measurements in tension, and (b) non-destructive resonant ultrasound spectroscopy. Both techniques yielded similar values of Young's modulus. The modulus decreased with increasing microporosity, in accordance with predicted values. Cooling rate affected the Ag3Sn intermetallic morphology, but not Young's modulus since the distribution of the particles was relatively random. This result was confirmed by microstructure-based finite element modeling.
AB - Accurate and reproducible measurements of the Young's modulus of solders are complicated by the early onset of yielding, microporosity, and variations in cooling rate. In this study, we report measurements of Young's modulus of an Sn-3.5 wt % Ag solder by two techniques: (a) loading-unloading measurements in tension, and (b) non-destructive resonant ultrasound spectroscopy. Both techniques yielded similar values of Young's modulus. The modulus decreased with increasing microporosity, in accordance with predicted values. Cooling rate affected the Ag3Sn intermetallic morphology, but not Young's modulus since the distribution of the particles was relatively random. This result was confirmed by microstructure-based finite element modeling.
UR - http://www.scopus.com/inward/record.url?scp=3242671329&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=3242671329&partnerID=8YFLogxK
U2 - 10.1023/B:JMSE.0000025683.19987.b3
DO - 10.1023/B:JMSE.0000025683.19987.b3
M3 - Article
AN - SCOPUS:3242671329
SN - 0957-4522
VL - 15
SP - 385
EP - 388
JO - Journal of Materials Science: Materials in Electronics
JF - Journal of Materials Science: Materials in Electronics
IS - 6
ER -