Fingerprint
Dive into the research topics of 'Materials characterization of Si<sub>1-x-y</sub>Ge<sub>x</sub>C<sub>y</sub>/Si superlattice structures'. Together they form a unique fingerprint.
Engineering & Materials Science
Secondary ion mass spectrometry
Ions
Backscattering
Characterization (materials science)
High resolution transmission electron microscopy
Film growth
Molecular beam epitaxy
Stacking faults
Electrons
X ray diffraction
Carbon
Defects
Chemical analysis
Chemical Compounds
Secondary ion mass spectrometry
Backscattering
Characterization (materials science)
Ions
High resolution transmission electron microscopy
Film growth
Stacking faults
Transmission electron microscopy
Carbon
X ray diffraction
Electrons
Defects
Chemical analysis
Physics & Astronomy
secondary ion mass spectrometry
backscattering
characterization
ions
transmission electron microscopy
crystal defects
molecular beam epitaxy
carbon
high resolution
sensitivity
defects
profiles
diffraction
x rays
electrons