We have evaluated a novel method of determining the mass thickness from the electron energy-loss spectrum. This method relies on spectral normalization procedures and does not require a knowledge of inelastic scattering cross sections or mean free paths. For specimens containing only light elements, the chemical composition need not be known and the procedure should be a useful adjunct to the microanalysis of biological materials.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics