Mass-thickness determination by Bethe-sum-rule normalization of the electron energy-loss spectrum

P. A. Crozier; R. F. Egerton

doi:10.1016/0304-3991(89)90197-6

Mass-thickness determination by Bethe-sum-rule normalization of the electron energy-loss spectrum

P. A. Crozier, R. F. Egerton

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

We have evaluated a novel method of determining the mass thickness from the electron energy-loss spectrum. This method relies on spectral normalization procedures and does not require a knowledge of inelastic scattering cross sections or mean free paths. For specimens containing only light elements, the chemical composition need not be known and the procedure should be a useful adjunct to the microanalysis of biological materials.

Original language	English (US)
Pages (from-to)	9-18
Number of pages	10
Journal	Ultramicroscopy
Volume	27
Issue number	1
DOIs	https://doi.org/10.1016/0304-3991(89)90197-6
State	Published - Jan 1 1989
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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10.1016/0304-3991(89)90197-6

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title = "Mass-thickness determination by Bethe-sum-rule normalization of the electron energy-loss spectrum",

abstract = "We have evaluated a novel method of determining the mass thickness from the electron energy-loss spectrum. This method relies on spectral normalization procedures and does not require a knowledge of inelastic scattering cross sections or mean free paths. For specimens containing only light elements, the chemical composition need not be known and the procedure should be a useful adjunct to the microanalysis of biological materials.",

author = "Crozier, {P. A.} and Egerton, {R. F.}",

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AU - Crozier, P. A.

AU - Egerton, R. F.

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Y1 - 1989/1/1

N2 - We have evaluated a novel method of determining the mass thickness from the electron energy-loss spectrum. This method relies on spectral normalization procedures and does not require a knowledge of inelastic scattering cross sections or mean free paths. For specimens containing only light elements, the chemical composition need not be known and the procedure should be a useful adjunct to the microanalysis of biological materials.

AB - We have evaluated a novel method of determining the mass thickness from the electron energy-loss spectrum. This method relies on spectral normalization procedures and does not require a knowledge of inelastic scattering cross sections or mean free paths. For specimens containing only light elements, the chemical composition need not be known and the procedure should be a useful adjunct to the microanalysis of biological materials.

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AN - SCOPUS:0024305134

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JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 1

ER -

Mass-thickness determination by Bethe-sum-rule normalization of the electron energy-loss spectrum

Abstract

ASJC Scopus subject areas

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