Mass-thickness determination by Bethe-sum-rule normalization of the electron energy-loss spectrum

P. A. Crozier, R. F. Egerton

Research output: Contribution to journalArticle

7 Scopus citations

Abstract

We have evaluated a novel method of determining the mass thickness from the electron energy-loss spectrum. This method relies on spectral normalization procedures and does not require a knowledge of inelastic scattering cross sections or mean free paths. For specimens containing only light elements, the chemical composition need not be known and the procedure should be a useful adjunct to the microanalysis of biological materials.

Original languageEnglish (US)
Pages (from-to)9-18
Number of pages10
JournalUltramicroscopy
Volume27
Issue number1
DOIs
StatePublished - Jan 1 1989
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

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