Mapping the Electrostatic Profile Across Axial p-n Junctions in Si nanowires using Off-Axis Electron Holography

Zhaofeng Gan, Daniel E. Smith, Martha McCartney, D. E. Perea, S. T. Picraux

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)1826-1827
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
DOIs
StatePublished - 2012

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Electron holography
p-n junctions
holography
Nanowires
Electrostatics
nanowires
electrostatics
profiles
electrons

ASJC Scopus subject areas

  • Instrumentation

Cite this

Mapping the Electrostatic Profile Across Axial p-n Junctions in Si nanowires using Off-Axis Electron Holography. / Gan, Zhaofeng; Smith, Daniel E.; McCartney, Martha; Perea, D. E.; Picraux, S. T.

In: Microscopy and Microanalysis, Vol. 18, 2012, p. 1826-1827.

Research output: Contribution to journalArticle

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