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Mapping statistical process variations toward circuit performance variability: An analytical modeling approach
Yu Cao
, Lawrence T. Clark
Electrical Engineering
Connection One (C1)
Electrical, Computer, and Energy Engineering, School of (IAFSE-ECEE)
Solid State Electronics Research Center (CSSER)
Research output
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›
Article
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peer-review
42
Scopus citations
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Engineering & Materials Science
Networks (circuits)
100%
Threshold voltage
49%
Scalability
36%