Mapping polarization fields in Al0.85In0.15N/AlN/GaN heterostructures

Lin Zhou, David A. Cullen, David Smith, Anas Mouti, M. Gonschorek, E. Feltin, J. F. Carlin, N. Grandjean, Martha McCartney

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)1048-1049
Number of pages2
JournalMicroscopy and Microanalysis
Volume15
Issue numberSUPPL. 2
DOIs
StatePublished - Jul 2009

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Heterojunctions
Polarization
polarization

ASJC Scopus subject areas

  • Instrumentation

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Mapping polarization fields in Al0.85In0.15N/AlN/GaN heterostructures. / Zhou, Lin; Cullen, David A.; Smith, David; Mouti, Anas; Gonschorek, M.; Feltin, E.; Carlin, J. F.; Grandjean, N.; McCartney, Martha.

In: Microscopy and Microanalysis, Vol. 15, No. SUPPL. 2, 07.2009, p. 1048-1049.

Research output: Contribution to journalArticle

Zhou, L, Cullen, DA, Smith, D, Mouti, A, Gonschorek, M, Feltin, E, Carlin, JF, Grandjean, N & McCartney, M 2009, 'Mapping polarization fields in Al0.85In0.15N/AlN/GaN heterostructures', Microscopy and Microanalysis, vol. 15, no. SUPPL. 2, pp. 1048-1049. https://doi.org/10.1017/S1431927609097499
Zhou, Lin ; Cullen, David A. ; Smith, David ; Mouti, Anas ; Gonschorek, M. ; Feltin, E. ; Carlin, J. F. ; Grandjean, N. ; McCartney, Martha. / Mapping polarization fields in Al0.85In0.15N/AlN/GaN heterostructures. In: Microscopy and Microanalysis. 2009 ; Vol. 15, No. SUPPL. 2. pp. 1048-1049.
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