Mapping polarization fields in Al0.85In0.15N/AlN/GaN heterostructures

Lin Zhou, David A. Cullen, David Smith, Anas Mouti, M. Gonschorek, E. Feltin, J. F. Carlin, N. Grandjean, Martha McCartney

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)1048-1049
Number of pages2
JournalMicroscopy and Microanalysis
Volume15
Issue numberSUPPL. 2
DOIs
StatePublished - Jul 2009

ASJC Scopus subject areas

  • Instrumentation

Cite this

Zhou, L., Cullen, D. A., Smith, D., Mouti, A., Gonschorek, M., Feltin, E., Carlin, J. F., Grandjean, N., & McCartney, M. (2009). Mapping polarization fields in Al0.85In0.15N/AlN/GaN heterostructures. Microscopy and Microanalysis, 15(SUPPL. 2), 1048-1049. https://doi.org/10.1017/S1431927609097499