TY - GEN
T1 - Mapping of Local Defects and Voltages in Solar Cells using Non-Contact Electrostatic Voltmeter Method
AU - Raza, Hamza Ahmad
AU - Tamizhmani, Govindasamy
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - Underperforming cells in a photovoltaic (PV) module or the modules in a PV string are typically detected and mapped using electroluminescence (EL) infrared (IR) imaging, and current voltage (IV) curve techniques. In the current work, a non-contact electrostatic voltmeter (ESV) technique is presented to detect and map the underperforming spots in a cell and the cells in a module. The ESV technique relies on the voltage mapping of the charged surface of the superstrate glass. The voltage values obtained using ESV at various good and poor performing spots of the cells have been validated using the voltage values obtained in EL analysis. The difference between EL-derived voltage and ESV-measured voltage is determined to be less than 2%. In this work, we combine the strengths of two complementary techniques of ESV (strength: quantitative) and EL (strength: spatial mapping) to obtain a quantitative spatial mapping of defects. This work is further extendable to detect poor performing modules in PV power plants.
AB - Underperforming cells in a photovoltaic (PV) module or the modules in a PV string are typically detected and mapped using electroluminescence (EL) infrared (IR) imaging, and current voltage (IV) curve techniques. In the current work, a non-contact electrostatic voltmeter (ESV) technique is presented to detect and map the underperforming spots in a cell and the cells in a module. The ESV technique relies on the voltage mapping of the charged surface of the superstrate glass. The voltage values obtained using ESV at various good and poor performing spots of the cells have been validated using the voltage values obtained in EL analysis. The difference between EL-derived voltage and ESV-measured voltage is determined to be less than 2%. In this work, we combine the strengths of two complementary techniques of ESV (strength: quantitative) and EL (strength: spatial mapping) to obtain a quantitative spatial mapping of defects. This work is further extendable to detect poor performing modules in PV power plants.
KW - Crack detection
KW - electroluminescence
KW - electrostatic voltmeter
KW - solar cell characterization
UR - http://www.scopus.com/inward/record.url?scp=85142828184&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85142828184&partnerID=8YFLogxK
U2 - 10.1109/PVSC48317.2022.9938734
DO - 10.1109/PVSC48317.2022.9938734
M3 - Conference contribution
AN - SCOPUS:85142828184
T3 - Conference Record of the IEEE Photovoltaic Specialists Conference
SP - 261
EP - 263
BT - 2022 IEEE 49th Photovoltaics Specialists Conference, PVSC 2022
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 49th IEEE Photovoltaics Specialists Conference, PVSC 2022
Y2 - 5 June 2022 through 10 June 2022
ER -