Abstract

Local quantum capacitance of graphene is imaged with plasmonics-based electrical impedance microscopy, from which the local density and polarity of charged impurities, electron and hole puddles associated with the charged impurities, and the density of the impurity states are determined.

Original languageEnglish (US)
Pages (from-to)6213-6219
Number of pages7
JournalAdvanced Materials
Volume27
Issue number40
DOIs
StatePublished - Oct 1 2015

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Graphene
Capacitance
Impurities
Imaging techniques
Acoustic impedance
Microscopic examination
Electrons

Keywords

  • electron and hole puddles
  • graphene
  • plasmonic imaging
  • quantum capacitance

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Mapping Local Quantum Capacitance and Charged Impurities in Graphene via Plasmonic Impedance Imaging. / Shan, Xiaonan; Chen, Shan; Wang, Hui; Chen, Zixuan; Guan, Yan; Wang, Yixian; Wang, Shaopeng; Chen, Hong Yuan; Tao, Nongjian.

In: Advanced Materials, Vol. 27, No. 40, 01.10.2015, p. 6213-6219.

Research output: Contribution to journalArticle

Shan, Xiaonan ; Chen, Shan ; Wang, Hui ; Chen, Zixuan ; Guan, Yan ; Wang, Yixian ; Wang, Shaopeng ; Chen, Hong Yuan ; Tao, Nongjian. / Mapping Local Quantum Capacitance and Charged Impurities in Graphene via Plasmonic Impedance Imaging. In: Advanced Materials. 2015 ; Vol. 27, No. 40. pp. 6213-6219.
@article{86b598f1158643489a0541e3f3daa298,
title = "Mapping Local Quantum Capacitance and Charged Impurities in Graphene via Plasmonic Impedance Imaging",
abstract = "Local quantum capacitance of graphene is imaged with plasmonics-based electrical impedance microscopy, from which the local density and polarity of charged impurities, electron and hole puddles associated with the charged impurities, and the density of the impurity states are determined.",
keywords = "electron and hole puddles, graphene, plasmonic imaging, quantum capacitance",
author = "Xiaonan Shan and Shan Chen and Hui Wang and Zixuan Chen and Yan Guan and Yixian Wang and Shaopeng Wang and Chen, {Hong Yuan} and Nongjian Tao",
year = "2015",
month = "10",
day = "1",
doi = "10.1002/adma.201502822",
language = "English (US)",
volume = "27",
pages = "6213--6219",
journal = "Advanced Materials",
issn = "0935-9648",
publisher = "Wiley-VCH Verlag",
number = "40",

}

TY - JOUR

T1 - Mapping Local Quantum Capacitance and Charged Impurities in Graphene via Plasmonic Impedance Imaging

AU - Shan, Xiaonan

AU - Chen, Shan

AU - Wang, Hui

AU - Chen, Zixuan

AU - Guan, Yan

AU - Wang, Yixian

AU - Wang, Shaopeng

AU - Chen, Hong Yuan

AU - Tao, Nongjian

PY - 2015/10/1

Y1 - 2015/10/1

N2 - Local quantum capacitance of graphene is imaged with plasmonics-based electrical impedance microscopy, from which the local density and polarity of charged impurities, electron and hole puddles associated with the charged impurities, and the density of the impurity states are determined.

AB - Local quantum capacitance of graphene is imaged with plasmonics-based electrical impedance microscopy, from which the local density and polarity of charged impurities, electron and hole puddles associated with the charged impurities, and the density of the impurity states are determined.

KW - electron and hole puddles

KW - graphene

KW - plasmonic imaging

KW - quantum capacitance

UR - http://www.scopus.com/inward/record.url?scp=84945444371&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84945444371&partnerID=8YFLogxK

U2 - 10.1002/adma.201502822

DO - 10.1002/adma.201502822

M3 - Article

VL - 27

SP - 6213

EP - 6219

JO - Advanced Materials

JF - Advanced Materials

SN - 0935-9648

IS - 40

ER -