Mapping Local Quantum Capacitance and Charged Impurities in Graphene via Plasmonic Impedance Imaging

Xiaonan Shan, Shan Chen, Hui Wang, Zixuan Chen, Yan Guan, Yixian Wang, Shaopeng Wang, Hong Yuan Chen, Nongjian Tao

Research output: Contribution to journalArticlepeer-review

20 Scopus citations

Abstract

Local quantum capacitance of graphene is imaged with plasmonics-based electrical impedance microscopy, from which the local density and polarity of charged impurities, electron and hole puddles associated with the charged impurities, and the density of the impurity states are determined.

Original languageEnglish (US)
Pages (from-to)6213-6219
Number of pages7
JournalAdvanced Materials
Volume27
Issue number40
DOIs
StatePublished - Oct 1 2015

Keywords

  • electron and hole puddles
  • graphene
  • plasmonic imaging
  • quantum capacitance

ASJC Scopus subject areas

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

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