Mapping Local Quantum Capacitance and Charged Impurities in Graphene via Plasmonic Impedance Imaging

Xiaonan Shan; Shan Chen; Hui Wang; Zixuan Chen; Yan Guan; Yixian Wang; Shaopeng Wang; Hong Yuan Chen; Nongjian Tao

doi:10.1002/adma.201502822

Mapping Local Quantum Capacitance and Charged Impurities in Graphene via Plasmonic Impedance Imaging

Xiaonan Shan, Shan Chen, Hui Wang, Zixuan Chen, Yan Guan, Yixian Wang, Shaopeng Wang, Hong Yuan Chen, Nongjian Tao

Research output: Contribution to journal › Article › peer-review

33 Scopus citations

Abstract

Local quantum capacitance of graphene is imaged with plasmonics-based electrical impedance microscopy, from which the local density and polarity of charged impurities, electron and hole puddles associated with the charged impurities, and the density of the impurity states are determined.

Original language	English (US)
Pages (from-to)	6213-6219
Number of pages	7
Journal	Advanced Materials
Volume	27
Issue number	40
DOIs	https://doi.org/10.1002/adma.201502822
State	Published - Oct 1 2015

Keywords

electron and hole puddles
graphene
plasmonic imaging
quantum capacitance

ASJC Scopus subject areas

Materials Science(all)
Mechanics of Materials
Mechanical Engineering

Access to Document

10.1002/adma.201502822

Cite this

@article{86b598f1158643489a0541e3f3daa298,

title = "Mapping Local Quantum Capacitance and Charged Impurities in Graphene via Plasmonic Impedance Imaging",

abstract = "Local quantum capacitance of graphene is imaged with plasmonics-based electrical impedance microscopy, from which the local density and polarity of charged impurities, electron and hole puddles associated with the charged impurities, and the density of the impurity states are determined.",

keywords = "electron and hole puddles, graphene, plasmonic imaging, quantum capacitance",

author = "Xiaonan Shan and Shan Chen and Hui Wang and Zixuan Chen and Yan Guan and Yixian Wang and Shaopeng Wang and Chen, {Hong Yuan} and Nongjian Tao",

year = "2015",

month = oct,

day = "1",

doi = "10.1002/adma.201502822",

language = "English (US)",

volume = "27",

pages = "6213--6219",

journal = "Advanced Materials",

issn = "0935-9648",

publisher = "Wiley-VCH Verlag",

number = "40",

}

TY - JOUR

T1 - Mapping Local Quantum Capacitance and Charged Impurities in Graphene via Plasmonic Impedance Imaging

AU - Shan, Xiaonan

AU - Chen, Shan

AU - Wang, Hui

AU - Chen, Zixuan

AU - Guan, Yan

AU - Wang, Yixian

AU - Wang, Shaopeng

AU - Chen, Hong Yuan

AU - Tao, Nongjian

PY - 2015/10/1

Y1 - 2015/10/1

N2 - Local quantum capacitance of graphene is imaged with plasmonics-based electrical impedance microscopy, from which the local density and polarity of charged impurities, electron and hole puddles associated with the charged impurities, and the density of the impurity states are determined.

AB - Local quantum capacitance of graphene is imaged with plasmonics-based electrical impedance microscopy, from which the local density and polarity of charged impurities, electron and hole puddles associated with the charged impurities, and the density of the impurity states are determined.

KW - electron and hole puddles

KW - graphene

KW - plasmonic imaging

KW - quantum capacitance

UR - http://www.scopus.com/inward/record.url?scp=84945444371&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84945444371&partnerID=8YFLogxK

U2 - 10.1002/adma.201502822

DO - 10.1002/adma.201502822

M3 - Article

C2 - 26356349

AN - SCOPUS:84945444371

SN - 0935-9648

VL - 27

SP - 6213

EP - 6219

JO - Advanced Materials

JF - Advanced Materials

IS - 40

ER -

Mapping Local Quantum Capacitance and Charged Impurities in Graphene via Plasmonic Impedance Imaging

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this